Senior Fitness - Exercise and Nutrition for Aging Men and Women
FREE Article Feed for your website.
Home Ownership Magazine
Party Planning Information
Article Marketing Resources
Bio-Medical Research Article Database
Informative Articles on Life, Love and Happiness
Tutorials on Business to Writing
Famous Quotes from Famous People
Song Lyric Information
New US Patent Information
Comprehensive List of Content by Category
Online Auctions and Shopping Related Articles
Article Search
Most Recent Articles
Title: Method and apparatus to guarantee type and initialization safety in multithreaded programs
Patent Number: 7,434,212 Issued on 10/07/2008 to Wang

Title: Transient shared computer resource and settings change bubble for computer programs
Patent Number: 7,434,211 Issued on 10/07/2008 to Wynn,   et al.

Title: Interposing library for page size dependency checking
Patent Number: 7,434,210 Issued on 10/07/2008 to Tucker

Title: Method and apparatus for performing native binding to execute native code
Patent Number: 7,434,209 Issued on 10/07/2008 to Brown,   et al.

Title: Floating debugger
Patent Number: 7,434,207 Issued on 10/07/2008 to Spencer

Title: Identifying memory leaks in computer systems
Patent Number: 7,434,206 Issued on 10/07/2008 to Seidman,   et al.

Title: Method and apparatus for managing software processes
Patent Number: 7,434,204 Issued on 10/07/2008 to Everingham,   et al.

Title: Software logistics for pattern-based applications
Patent Number: 7,434,203 Issued on 10/07/2008 to Stienhans,   et al.

Title: System and method for software component dependency checking
Patent Number: 7,434,202 Issued on 10/07/2008 to Kramer

Title: Method and apparatus providing for extendable interaction between firmware and operating systems on digital devices
Patent Number: 7,434,201 Issued on 10/07/2008 to Culter

Title: Using incremental generation to develop software applications
Patent Number: 7,434,200 Issued on 10/07/2008 to Bender

Title: Method and computer program product for detecting potential failures in an integrated circuit design after optical proximity correction
Patent Number: 7,434,198 Issued on 10/07/2008 to Strelkova,   et al.

Title: User interface for providing consolidation and access
Patent Number: 7,434,177 Issued on 10/07/2008 to Ording,   et al.

Title: System and method for encoding decoding parsing and translating emotive content in electronic communication
Patent Number: 7,434,176 Issued on 10/07/2008 to Froloff

Title: Method and system for zooming in and out of paginated content
Patent Number: 7,434,174 Issued on 10/07/2008 to Sellers,   et al.

Title: Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
Patent Number: 7,434,130 Issued on 10/07/2008 to Huisman,   et al.

Title: Systems and methods for identifying system links
Patent Number: 7,434,128 Issued on 10/07/2008 to Terry

Title: eFuse programming data alignment verification apparatus and method
Patent Number: 7,434,127 Issued on 10/07/2008 to Riley

Title: Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults
Patent Number: 7,434,126 Issued on 10/07/2008 to Wang,   et al.

Title: Integrated circuit, test system and method for reading out an error datum from the integrated circuit
Patent Number: 7,434,125 Issued on 10/07/2008 to Frankowsky

Title: Reduced pattern memory in digital test equipment
Patent Number: 7,434,124 Issued on 10/07/2008 to Baker,   et al.

Title: Flash memory device for performing bad block management and method of performing bad block management of flash memory device
Patent Number: 7,434,122 Issued on 10/07/2008 to Jo

Title: Integrated memory device and method for its testing and manufacture
Patent Number: 7,434,121 Issued on 10/07/2008 to Astor

Title: Test mode control circuit
Patent Number: 7,434,120 Issued on 10/07/2008 to Jang,   et al.

Title: Parameterized signal conditioning
Patent Number: 7,434,118 Issued on 10/07/2008 to Moessinger,   et al.

Title: Method and apparatus of determining bad frame indication for speech service in a wireless communication system
Patent Number: 7,434,117 Issued on 10/07/2008 to Chung,   et al.

Title: Unitary testing apparatus for performing bit error rate measurements on optical components
Patent Number: 7,434,116 Issued on 10/07/2008 to Franke,   et al.

Title: Error handling scheme for time-critical processing environments
Patent Number: 7,434,110 Issued on 10/07/2008 to Hall

Title: Masking within a data processing system having applicability for a development interface
Patent Number: 7,434,108 Issued on 10/07/2008 to Moyer,   et al.

Title: Cluster network having multiple server nodes
Patent Number: 7,434,107 Issued on 10/07/2008 to Marks

Title: Reference clock failure detection on serial interfaces
Patent Number: 7,434,106 Issued on 10/07/2008 to Miller

Title: Selective self-healing of memory errors using allocation location information
Patent Number: 7,434,105 Issued on 10/07/2008 to Rodriguez-Rivera,   et al.

Title: Method and system for efficiently testing core functionality of clustered configurations
Patent Number: 7,434,104 Issued on 10/07/2008 to Skeoch,   et al.

Title: Ink containment system for an ink-jet pen
Patent Number: 6,890,068 Issued on 05/10/2005 to Kawamura,   et al.

Title: Modular tilt handling system
Patent Number: 6,890,259 Issued on 05/10/2005 to Breckner,   et al.

Title: Continuous extrusion using dynamic shoe positioning
Patent Number: 6,871,522 Issued on 03/29/2005 to Maddock,   et al.

Title: Greaseless fulcrum for a railcar door
Patent Number: 6,807,774 Issued on 10/26/2004 to Nottingham,   et al.

Title: Method and apparatus for reducing seek acoustics in a disk drive using feedback during large current transitions
Patent Number: 7,082,010 Issued on 07/25/2006 to Hansen,   et al.

Title: Cover for ball-grid array connector
Patent Number: 6,900,389 Issued on 05/31/2005 to Shue,   et al.

Title: V-type internal combustion engine
Patent Number: 6,769,390 Issued on 08/03/2004 to Hattori

Title: Method of manufacturing a capacitor having tantalum oxide film as an insulating film
Patent Number: 6,797,560 Issued on 09/28/2004 to Hosoda,   et al.

Title: Fabrication method for lines of semiconductor device
Patent Number: 6,797,635 Issued on 09/28/2004 to Kuo

Title: Deep trench formation in semiconductor device fabrication
Patent Number: 7,101,806 Issued on 09/05/2006 to Cline,   et al.

Title: High-K tunneling dielectric for read only memory device and fabrication method thereof
Patent Number: 6,797,567 Issued on 09/28/2004 to Chang

Title: One mask PNP (or NPN) transistor allowing high performance
Patent Number: 6,797,577 Issued on 09/28/2004 to Johnson,   et al.

Title: Memory cell and method for forming the same
Patent Number: 6,797,573 Issued on 09/28/2004 to Brown

Title: Methods and apparatus for improving performance of gravel packing systems
Patent Number: 6,761,218 Issued on 07/13/2004 to Nguyen,   et al.

Title: Method of forming a local interconnect
Patent Number: 6,797,600 Issued on 09/28/2004 to Manning

Title: Use of tunable laser for optical performance monitoring in WDM system
Patent Number: 6,795,607 Issued on 09/21/2004 to Archambault,   et al.

Title: Method of manufacturing semiconductor device
Patent Number: 6,797,571 Issued on 09/28/2004 to Nagaoka,   et al.

Title: Local area network having multiple channel wireless access
Patent Number: 7,013,138 Issued on 03/14/2006 to Mahany

Title: Coupling device
Patent Number: 7,143,994 Issued on 12/05/2006 to Ostergaard,   et al.

Title: Water purifying device
Patent Number: 6,875,361 Issued on 04/05/2005 to Park

Title: Device for measuring the angle and/or the angular velocity of a rotatable body and/or the torque acting upon said body
Patent Number: 6,935,193 Issued on 08/30/2005 to Heisenberg,   et al.

Title: Tracking vibrations in a pipeline network
Patent Number: 6,957,157 Issued on 10/18/2005 to Lander

Title: Arrangement for exchange of empty bobbins with full bobbins in a bobbin creel
Patent Number: 6,769,854 Issued on 08/03/2004 to Wolf,   et al.

Title: Waveguide and process for the production thereof
Patent Number: 7,016,588 Issued on 03/21/2006 to Edlinger,   et al.

Title: Vehicle generator having circuit protective cover
Patent Number: 6,979,921 Issued on 12/27/2005 to Misaki

Title: Envelope follower end point detection in time division multiplexed processes
Patent Number: 7,101,805 Issued on 09/05/2006 to Johnson,   et al.

Title: Method of manufacturing semiconductor device using chemical mechanical polishing
Patent Number: 7,101,801 Issued on 09/05/2006 to Ono,   et al.

Title: Adhesive treatment for oral fungal infection
Patent Number: 6,767,552 Issued on 07/27/2004 to Narang

Title: Method for forming fuse integrated with dual damascene process
Patent Number: 7,101,804 Issued on 09/05/2006 to Choi,   et al.

Title: Method for the generation of modulation by frequency division followed by frequency multiplication, and radiofrequency apparatus
Patent Number: 7,013,115 Issued on 03/14/2006 to Collin,   et al.

Title: Analog power detection for gain control operations
Patent Number: 7,013,117 Issued on 03/14/2006 to Darabi

Title: Method of fabricating semiconductor device
Patent Number: 7,101,807 Issued on 09/05/2006 to Ishikawa

Title: Electromagnetic interference filter
Patent Number: 6,816,033 Issued on 11/09/2004 to Richarte,   et al.

Title: Accuracy automated optical time domain reflectometry optical return loss measurements using a "Smart" Test Fiber Module
Patent Number: 7,016,024 Issued on 03/21/2006 to Bridge,   et al.

Title: Air dryer system and method employing a jet engine
Patent Number: 6,944,967 Issued on 09/20/2005 to Staples

Title: Ventilation and cooling in selective deposition modeling
Patent Number: 7,008,206 Issued on 03/07/2006 to Fong,   et al.

Title: Mini DIN connector having a reduced height above a printed circuit board
Patent Number: 7,008,266 Issued on 03/07/2006 to Fang

Title: Matching DSL data link layer protocol detection
Patent Number: 7,006,452 Issued on 02/28/2006 to Lund

Title: Semiconductor memory device having improved arrangement for replacing failed bit lines
Patent Number: 6,909,646 Issued on 06/21/2005 to Hasegawa,   et al.

Title: Methods and systems for providing MEMS devices with a top cap and upper sense plate
Patent Number: 7,005,732 Issued on 02/28/2006 to Horning,   et al.

Title: Stacked semiconductor package with circuit side polymer layer
Patent Number: 6,949,834 Issued on 09/27/2005 to Connell,   et al.

Title: Light collection system converting ultraviolet energy to visible light
Patent Number: 7,008,071 Issued on 03/07/2006 to Buelow, II,   et al.

Dual path linear voltage regulator Number:7,402,985 from the United States Patent and Trademark Office (PTO) owispatent

Home    Author Login    Submit Article    Article Search    Add Your Link    Edit Your Link    Contact Us    Advertising    Disclaimer

   

 
Web LinkGrinder.com

Top Breaking News
     Greek, Cypriot Leaders Resume Unification Talks in Nicosia by Nathan Morley
     Indonesia Tobacco Sales Grow, Raising Health Fears
     South Korea Allows Top Defector to Travel Overseas by VOA News

Title: Dual path linear voltage regulator

Abstract: A voltage regulator comprising two feedback loops for regulating a load voltage, where the first feedback loop comprises a pass transistor to source current to the load, and the second feedback loop comprises a shunt transistor to shunt current from the pass transistor to ground. The use of two feedback loops allows the design of a voltage regulator in which it small-signal impedance, as seen by a power rail, has a phase not less than -90 degrees. This mitigates interactions between the power rail and the voltage regulator that may lead to oscillations, without the need for a relatively large de-coupling capacitor. Other embodiments are described and claimed.

Patent Number: 7,402,985 Issued on 07/22/2008 to Zlatkovic


Inventors: Zlatkovic; Vladimir (Belmont, MA)
Assignee: Intel Corporation (Santa Clara, CA)
Appl. No.: 11/516,214
Filed: September 6, 2006


Current U.S. Class: 323/275 ; 323/270; 323/274
Current International Class: G05F 1/565 (20060101); G05F 1/575 (20060101)
Field of Search: 323/269,270,273,274,275,280,281


References Cited [Referenced By]

U.S. Patent Documents
5552697 September 1996 Chan
5608312 March 1997 Wallace
7126317 October 2006 Schreck
Primary Examiner: Laxton; Gary L
Attorney, Agent or Firm: Kalson; Seth Z.

Claims



What is claimed is:

1. A circuit comprising: a node having a voltage; a first feedback loop to regulate the node voltage, comprising a pass transistor to source a current to the node, the pass transistor having a gate, the first feedback loop comprising a unity gain buffer having an output port connected to the gate of the pass transistor and having an input port; and a second feedback loop to regulate the node voltage, comprising a shunt transistor having a gate-to-source voltage and a threshold voltage, the shunt transistor to shunt a portion of the current when the gate-to-source voltage exceeds the threshold voltage, the shunt transistor having a gate connected to the input port of the unity gain buffer.

2. The circuit as set forth in claim 1, wherein the pass transistor is a pMOSFET and the shunt transistor is a nMOSFET.

3. The circuit as set forth in claim 1, the second feedback loop further comprising a first operational amplifier having a positive input port coupled to the node and an output port coupled to the gate of the shunt transistor.

4. The circuit as set forth in claim 1, wherein the first feedback loop has a first operating bandwidth and the second feedback loop has a second operating bandwidth larger than the first operating bandwidth.

5. The circuit as set forth in claim 3, the pass transistor comprising a gate, the first feedback loop further comprising a second operational amplifier having a positive input port coupled to the output port of the first operational amplifier, a negative input port, and an output port coupled to the negative input port of the second operational amplifier and coupled to the gate of the pass transistor.

6. The circuit as set forth in claim 3, wherein the first feedback loop has a first operating bandwidth and the second feedback loop has a second operating bandwidth larger than the first operating bandwidth.

7. A circuit comprising: a node; a pass transistor comprising a gate and a drain connected to the node; a buffer comprising an input port and an output port connected to the gate of the pass transistor; a shunt transistor comprising a gate and a drain connected to the node; and a first operational amplifier comprising an output port connected to the gate of the shunt transistor and to the input port of the buffer, and a positive input port connected to the drain of the shunt transistor.

8. The circuit as set forth in claim 7, wherein the pass transistor is a pMOSFET and the shunt transistor is a nMOSFET.

9. The circuit as set forth in claim 7, the buffer comprising a second operational amplifier comprising an output port connected to the gate of the pass transistor, a negative input port connected to the output port of the second operational amplifier, and a positive input port connected to the output port of the first operational amplifier.

10. The circuit as set forth in claim 7, the pass transistor, the buffer, and the second operational amplifier forming a first feedback loop having a first operating bandwidth; and the shunt transistor and the first operational amplifier forming a second feedback loop having a second operating bandwidth greater than the first operating bandwidth.

11. The circuit as set forth in claim 10, the buffer comprising a second operational amplifier comprising an output port connected to the gate of the pass transistor, a negative input port connected to the output port of the second operational amplifier, and a positive input port connected to the output port of the first operational amplifier.

12. A computer system comprising: a memory; and a processor in communication with the memory, the processor comprising a voltage regulator, the voltage regulator comprising; a node having a voltage; a first feedback loop to regulate the node voltage, comprising a pass transistor to source a current to the node, the pass transistor having a gate, the first feedback loop comprising a unity gain buffer having an output port connected to the gate of the pass transistor and having an input port; and a second feedback loop to regulate the node voltage, comprising a shunt transistor having a gate-to-source voltage and a threshold voltage, the shunt transistor to shunt a portion of the current when the gate-to-source voltage exceeds the threshold voltage, the shunt transistor having a gate connected to the input port of the unity gain buffer.

13. The computer system as set forth in claim 12, wherein the pass transistor is a pMOSFET and the shunt transistor is a nMOSFET.

14. The computer system as set forth in claim 12, the second feedback loop further comprising a first operational amplifier having a positive input port coupled to the node and an output port coupled to the gate of the shunt transistor.

15. The computer system as set forth in claim 12, wherein the first feedback loop has a first operating bandwidth and the second feedback loop has a second operating bandwidth larger than the first operating bandwidth.

16. The computer system as set forth in claim 14, the pass transistor comprising a gate, the first feedback loop further comprising a second operational amplifier having a positive input port coupled to the output port of the first operational amplifier, a negative input port, and an output port coupled to the negative input port of the second operational amplifier and coupled to the gate of the pass transistor.

17. The computer system as set forth in claim 14, wherein the first feedback loop has a first operating bandwidth and the second feedback loop has a second operating bandwidth larger than the first operating bandwidth.
Description



FIELD

Embodiments of the present invention relate to electronic circuits, and more particularly, to voltage regulators.

BACKGROUND

A large class of linear voltage regulators provides a regulated voltage by way of a feedback loop comprising an operational amplifier and a pass transistor. An example of a linear voltage regulator is illustrated in FIG. 2. As is well known, a negative feedback loop regulates the voltage at node 202 to match a reference voltage V.sub.REF, where the feedback loop is formed by the output port of amplifier A connected to the gate of pass transistor Q, and the drain of transistor Q connected to the positive input port of amplifier A. The reference voltage V.sub.REF is applied at the negative input port to amplifier A. Load 204 is the circuit for which a regulated voltage is desired, and capacitor 204 is a de-coupling capacitor. Load 204 may be, for example, a circuit within a microprocessor. Particular examples include, but are not limited to, a phase locked loop, a delay locked loop, or a thermal sensor.

Let Z.sub.REG denote the small-signal impedance presented by the linear voltage regulator to voltage rail 204. It has been observed that there may be an undesirable interaction between the supply voltage Vcc at voltage rail 204 and the linear voltage regulator of FIG. 2. In particular, it has been observed that if the phase of the impedance Z.sub.REG falls below -90 degrees, there may be spontaneous oscillations at voltage rail 204. This problem is more likely to worsen as the number of linear voltage regulators connected to voltage rail 204 increases, as for example in applications in which there are more than one microprocessor core or more than one I/O (Input/Output) channel.

A linear voltage regulator of the type illustrated in FIG. 2 is generally designed so that the poles of its closed-loop transfer function are the zeros of its impedance Z.sub.REG. This results in the phase of the impedance Z.sub.REG being less than -90 degrees, unless the linear voltage regulator is designed to be over-damped. However, such an over-damped design is not necessarily trivial or desirable for some applications, as it generally requires a relatively large capacitor for compensation. Furthermore, such a relatively large capacitor results in a linear voltage regulator with a low operating bandwidth. A low operating bandwidth linear voltage regulator may need a large output de-coupling capacitor to provide adequate power supply rejection (PSR). But large output de-coupling capacitors are not necessarily desirable because of their size, and because of possible current leakage.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an embodiment of the present invention.

FIG. 2 is a prior art linear voltage regulator.

FIG. 3 is the small-signal circuit model for the embodiment of FIG. 1.

FIG. 4 illustrates plots of the magnitude and phase of the small-signal impedance for the model of FIG. 3.

FIG. 5 illustrates a portion of a computer system utilizing embodiments of the present invention.

DESCRIPTION OF EMBODIMENTS

FIG. 1 illustrates an embodiment of the present invention, which may be termed a dual path linear voltage regulator. A regulated voltage V.sub.REG at node 102 is provided to load 104. Load 104 may comprise a circuit, such as for example an analog circuit in which a well-regulated voltage is desired. In the embodiment of FIG. 1, a reference voltage V.sub.REF, applied at input port 106 of operational amplifier A1, sets the regulated voltage V.sub.REG. The dual path linear voltage regulator tracks V.sub.REF and adjusts its output voltage V.sub.REG so that these two voltages match. The reference voltage V.sub.REF may be generated by any one of well-known circuits, such as for example by a band-gap reference circuit.

Input port 106 is the inverting, or negative, input port of operational amplifier A1. Output port 108 of operational amplifier A1 is connected to the gate of transistor Mn. In the embodiment of FIG. 1, transistor Mn is an nMOSFET (n-Metal Oxide Semiconductor Field Effect Transistor). The source of transistor Mn is grounded (connected to substrate 110). The drain of transistor Mn is connected to input port 112, which is the non-inverting, or positive, input port of operational amplifier A1. The drain of transistor Mn is also connected to node 102 and to decoupling capacitor 120.

Output port 108 is connected to input port 114, the non-inverting, or positive, input port of operational amplifier A2. Output port 116 is connected to the inverting, or negative, input port of operational amplifier A2. Operational amplifier A2 is configured as a unity-gain buffer so that the voltage at output port 116 follows that of output port 108. Output port 116 is also connected to the gate of transistor Mp. In the embodiment of FIG. 1, transistor Mp is a pMOSFET. The drain of transistor Mp is connected to node 102, and the source of Mp is connected to voltage rail 118. Transistor Mp may be referred to as a pass transistor. Capacitor 122 is used to insert a low bandwidth pole at the output of operational amplifier A1, and it also improves the PSR by enabling transistor Mp to better reject V.sub.CC noise.

With the drain of transistor Mp connected to positive input port 112, there is a first feedback loop comprising operational amplifier A1, operational amplifier A2, and transistor Mp. With the drain of transistor Mn connected to positive input port 112, there is a second feedback loop comprising operational amplifier A1 and transistor Mn. This is the motivation for referring to an embodiment represented by FIG. 1 as a dual path linear voltage regulator.

In operation, if the voltage at node 102, V.sub.REG, were to increase above its desired regulated value, V.sub.REF, then the output voltage at output port 108 would increase. Because operational amplifier A2 is configured as a unity-gain buffer, the voltage at output port 116 would also increase, reducing the magnitude of the gate-to-source voltage of pass transistor Mp, causing pass transistor Mp to source less current to load 104, and thereby counteracting an increase in voltage at node 102. In addition, when the voltage at output port 108 increases, there is an increase in the gate-to-source voltage of transistor Mn. As a result, transistor Mn shunts current from node 102 to ground, further counteracting an increase in voltage at node 102. Accordingly, transistor Mn may be referred to as a shunt transistor.

For some embodiments, the operating bandwidth of the second feedback loop may be designed to be larger than that of the first feedback loop. For such embodiments, operational amplifier A2 lowers the magnitude of the gate-to-source voltage of transistor Mp slower than the rate that operational amplifier A1 increases the gate-to-source voltage of transistor Mn.

If the voltage V.sub.REG at node 102 were to decrease below V.sub.REF, then the output voltage at output port 108 would decrease, thereby increasing the magnitude of the gate-to-source voltage of pass transistor Mp, causing pass transistor Mp to source more current to load 104, thereby counteracting a decrease in voltage at node 102. In addition, a decrease in voltage at output port 108 below V.sub.REG decreases the gate-to-source voltage of shunt transistor Mn, causing shunt transistor Mn not to shunt current to ground. If for some embodiments the operating bandwidth of the second feedback loop is larger than that of the first feedback loop, then amplifier A2 would increase the gate-to-source voltage of transistor Mp slower than the rate that amplifier A1 would decrease the magnitude of the gate-to-source voltage of transistor Mn.

Transistor Mn shunts current from node 102 to ground when its gate-to-source voltage exceeds its threshold voltage. Although the shunting function provided by transistor Mn may degrade efficiency, the relatively fast response of the second feedback loop provided by amplifier A1 in conjunction with transistor Mn allows for the use of a smaller output de-coupling capacitor than might be needed if the second feedback loop were not present. Letting Z.sub.REG denote the small-signal impedance of the dual path linear voltage regulator as seen by voltage rail 118, Z.sub.REG is expected to have a phase not below -90 degrees. As a result, it is expected that output de-coupling capacitor 120 need not be as large as what might be needed if the second feedback loop were not present, and embodiments need not be over-damped in order for the phase of Z.sub.REG not to fall below -90 degrees. Z.sub.REG may be referred to as the regulator impedance.

An expression for the regulator impedance as seen by voltage rail 118 may be derived from a small-signal circuit model for FIG. 1, which is shown in FIG. 3. In FIG. 3, the small-signal model for transistor Mn is represented by voltage-controlled current source 302 and small-signal resistor 304, where gm.sub.n is the small-signal transconductance of transistor Mn. The small-signal model for transistor Mp is represented by voltage-controlled current source 306 and small-signal resistor 308, where gm.sub.p is the small-signal transconductance of transistor Mp. The small-signal impedance for load 104 is represented by impedance 310. Small-signal current source 312 is introduced to calculate the regulator impedance Z.sub.REG, where if v.sub.x is the small-signal voltage at node 314 and i.sub.x is the current provided by current source 312, then Z.sub.REG=v.sub.x/i.sub.x.

With the variables shown in FIG. 3 representing the various corresponding small-signal currents and impedances as indicated in FIG. 3, an expression for Z.sub.REG may be derived, which is given below.

.omega..times..times..times..omega..times..omega..times..function..omega..- times..times..times..times..omega..times..times..times..omega..times..omeg- a..times..times. ##EQU00001## The variables R.sub.x and .omega..sub.x in the above expression are defined as:

.times..times..times. ##EQU00002## .omega..times..times. ##EQU00002.2## In the above-displayed expression, Ao.sub.hbw is the open loop DC gain of operational amplifier A1, Ao.sub.lbw is the open loop DC gain of operational amplifier A2, .omega..sub.lbw is the open loop bandwidth of operational amplifier A2, and .omega..sub.hbw is the open loop bandwidth of operational amplifier A1.

FIG. 4 shows plots of the magnitude and phase of Z.sub.REG for typical values substituted for the variables in the above-displayed expression for Z.sub.REG. As seen from the plots, the phase angle for Z.sub.REG does not fall below -90 degrees.

Embodiments of the present invention are expected to find wide applications. One such application is to regulate the voltage provided to one or more circuits in one or more microprocessor execution cores by utilizing one or more dual path linear voltage regulators. FIG. 5 illustrates such an application, where a simplified, high-level diagram of a portion of a typical computer system is illustrated. In FIG. 5, microprocessor 502 communicates with chipset 504, where chipset 504 provides communication to system memory 506 and other I/O components, represented by block 508. Chipset 504 may comprise one or more distinct die, and memory 506 may represent a hierarchy of memory. Embodiments of the present invention may find application in microprocessor 502, indicated as blocks 500, as well as in other system components in FIG. 5. Applications of embodiments of the present invention are not limited to computer systems.

Various modifications may be made to the disclosed embodiments without departing from the scope of the invention as claimed below.

It is to be understood in these letters patent that the meaning of "A is connected to B", where A or B may be, for example, a node or device terminal, is that A and B are connected to each other so that the voltage potentials of A and B are substantially equal to each other. For example, A and B may be connected together by an interconnect (transmission line). In integrated circuit technology, the interconnect may be exceedingly short, comparable to the device dimension itself. For example, the gates of two transistors may be connected together by polysilicon, or copper interconnect, where the length of the polysilicon, or copper interconnect, is comparable to the gate lengths. As another example, A and B may be connected to each other by a switch, such as a transmission gate, so that their respective voltage potentials are substantially equal to each other when the switch is ON.

It is also to be understood in these letters patent that the meaning of "A is coupled to B" is that either A and B are connected to each other as described above, or that, although A and B may not be connected to each other as described above, there is nevertheless a device or circuit that is connected to both A and B. This device or circuit may include active or passive circuit elements, where the passive circuit elements may be distributed or lumped-parameter in nature. For example, A may be connected to a circuit element that in turn is connected to B.

It is also to be understood in these letters patent that various circuit blocks, such as current mirrors, amplifiers, etc., may include switches so as to be switched in or out of a larger circuit, and yet such circuit blocks may still be considered connected to the larger circuit because the various switches may be considered as included in the circuit block.

*


Free Web Sudoku Puzzles.
Solve with your browser.
9     2     7    
                6
2       5 8   1  
8   4       6    
      6   1      
    9       3   7
  8   4 1       5
3                
    6     3     8
What is it?



Add Your Site · Terms Of Service · Privacy Policy


DISCLAIMER
Linkgrinder is a free service that searches the Internet and indexes all files found so that you may search quickly and easily for shared files. These files are created and made available individually by users whose identity we are not aware of and who we have no control over. In essence we function like a search engine tool; these files ARE NOT STORED OR SERVED BY OUR NETWORK. We are not responsible for any materials obtained by using our service. We do not monitor any of the contents of these files. These files may contain viruses, illegal materials, materials inappropriate for minors, offensive files and the like. BY USING OUR SERVICE, YOU ASSUME FULL RESPONSIBILITY FOR DOWNLOADING THESE MATERIALS AND WILL INDEMNIFY US FOR ANY DAMAGES THAT MAY BE INCURRED.

For More Specific Information VIEW OUR TERMS OF SERVICE.

Thank you and Enjoy!