Most Recent Articles
Patent Number: 7,436,024 Issued on 10/14/2008 to Kumagai, et al.
Title: High blocking semiconductor component comprising a drift section
Patent Number: 7,436,023 Issued on 10/14/2008 to Hirler, et al.
Title: Enhancing Schottky breakdown voltage (BV) without affecting an integrated MOSFET-Schottky device layout
Patent Number: 7,436,022 Issued on 10/14/2008 to Bhalla, et al.
Title: Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing
Patent Number: 7,436,021 Issued on 10/14/2008 to Hao, et al.
Title: Flash memory with metal-insulator-metal tunneling program and erase
Patent Number: 7,436,020 Issued on 10/14/2008 to Forbes
Title: Non-volatile memory cells shaped to increase coupling to word lines
Patent Number: 7,436,019 Issued on 10/14/2008 to Lutze, et al.
Title: Discrete trap non-volatile multi-functional memory device
Patent Number: 7,436,018 Issued on 10/14/2008 to Bhattacharyya
Title: Semiconductor integrated circuit using a selective disposable spacer
Patent Number: 7,436,017 Issued on 10/14/2008 to Lee, et al.
Title: MIM capacitor with a cap layer over the conductive plates
Patent Number: 7,436,016 Issued on 10/14/2008 to Barth, et al.
Title: Driver for driving a load using a charge pump circuit
Patent Number: 7,436,015 Issued on 10/14/2008 to Tanaka, et al.
Title: Method of fabricating storage capacitor in semiconductor memory device, and storage capacitor structure
Patent Number: 7,436,014 Issued on 10/14/2008 to Son
Title: Ferroelectric memory device
Patent Number: 7,436,013 Issued on 10/14/2008 to Miyazawa, et al.
Title: Solid state imaging apparatus and method for fabricating the same
Patent Number: 7,436,012 Issued on 10/14/2008 to Mori, et al.
Title: CMOS image sensor
Patent Number: 7,436,011 Issued on 10/14/2008 to Chen, et al.
Title: Solid state imaging apparatus, method for driving the same and camera using the same
Patent Number: 7,436,010 Issued on 10/14/2008 to Mori, et al.
Title: Via structures and trench structures and dual damascene structures
Patent Number: 7,436,009 Issued on 10/14/2008 to Huang, et al.
Title: Semiconductor device
Patent Number: 7,436,004 Issued on 10/14/2008 to Shimoida, et al.
Title: Vertical thyristor for ESD protection and a method of fabricating a vertical thyristor for ESD protection
Patent Number: 7,436,003 Issued on 10/14/2008 to Jumpertz, et al.
Title: Surface-mountable radiation-emitting component
Patent Number: 7,436,002 Issued on 10/14/2008 to Brunner, et al.
Title: Vertical GaN-based LED and method of manufacturing the same
Patent Number: 7,436,001 Issued on 10/14/2008 to Lee, et al.
Title: Two dimensional light source using light emitting diode and liquid crystal display device using the two dimensional light source
Patent Number: 7,436,000 Issued on 10/14/2008 to Kim, et al.
Title: Semiconductor chip for optoelectronics and method for the production thereof
Patent Number: 7,435,999 Issued on 10/14/2008 to Windisch, et al.
Title: Semiconductor device, method of manufacturing the same, electro-optic device and electronic apparatus with a protective film
Patent Number: 7,435,998 Issued on 10/14/2008 to Kondo
Title: Component comprising a large number of light-emitting-diode chips
Patent Number: 7,435,997 Issued on 10/14/2008 to Arndt, et al.
Title: Nanowire light emitting device and method of fabricating the same
Patent Number: 7,435,996 Issued on 10/14/2008 to Jin, et al.
Title: Phosphor, semiconductor light emitting device, and fabrication method thereof
Patent Number: 7,435,995 Issued on 10/14/2008 to Ueda
Title: Semiconductor device and method for fabricating the same
Patent Number: 7,435,994 Issued on 10/14/2008 to Ueda
Title: High temperature, high voltage SiC void-less electronic package
Patent Number: 7,435,993 Issued on 10/14/2008 to Autry, et al.
Title: Active matrix type organic electroluminescent display device and method of manufacturing the same
Patent Number: 7,435,992 Issued on 10/14/2008 to Choi, et al.
Title: Micromechanical sensor
Patent Number: 7,435,991 Issued on 10/14/2008 to Baer, et al.
Title: Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer
Patent Number: 7,435,990 Issued on 10/14/2008 to Keller, et al.
Title: Semiconductor device with layer containing polysiloxane compound
Patent Number: 7,435,989 Issued on 10/14/2008 to Nakayama, et al.
Title: Semiconductor device including a MOSFET having a band-engineered superlattice with a semiconductor cap layer providing a channel
Patent Number: 7,435,988 Issued on 10/14/2008 to Mears, et al.
Title: Forming a type I heterostructure in a group IV semiconductor
Patent Number: 7,435,987 Issued on 10/14/2008 to Chui, et al.
Title: System and method for detecting repeating defects in a light-management film
Patent Number: 7,435,986 Issued on 10/14/2008 to Capaldo, et al.
Title: Zero-crossing point detection circuit
Patent Number: 7,435,985 Issued on 10/14/2008 to Kuo
Title: Imaging optical system and exposure apparatus
Patent Number: 7,435,984 Issued on 10/14/2008 to Sentoku, et al.
Title: Device for injecting electromagnetic radiation into a reactor
Patent Number: 7,435,983 Issued on 10/14/2008 to Benje
Title: Laser-driven light source
Patent Number: 7,435,982 Issued on 10/14/2008 to Smith
Title: Electron beam sterilizer
Patent Number: 7,435,981 Issued on 10/14/2008 to Naka, et al.
Title: Electron beam irradiation device
Patent Number: 7,435,980 Issued on 10/14/2008 to Nakao
Title: Optical device and method of manufacture
Patent Number: 7,435,979 Issued on 10/14/2008 to Ryzi, et al.
Title: System, method and a program for correcting conditions for controlling a charged particle beam for lithography and observation, and a program and method for manufacturing a semiconductor devic
Patent Number: 7,435,978 Issued on 10/14/2008 to Nakasugi, et al.
Title: Ion beam angle measurement systems and methods for ion implantation systems
Patent Number: 7,435,977 Issued on 10/14/2008 to Freer, et al.
Title: Ion beam device
Patent Number: 7,435,976 Issued on 10/14/2008 to Naito, et al.
Title: Scintillator plate for radiation and radiographic image detector
Patent Number: 7,435,975 Issued on 10/14/2008 to Shoji, et al.
Title: Electron microscope and specimen stage positioning control method for the electron microscope
Patent Number: 7,435,974 Issued on 10/14/2008 to Matsushima
Title: Material processing system and method
Patent Number: 7,435,973 Issued on 10/14/2008 to Koops, et al.
Title: Focused ion beam apparatus and liquid metal ion source
Patent Number: 7,435,972 Issued on 10/14/2008 to Madokoro, et al.
Title: Ion source
Patent Number: 7,435,971 Issued on 10/14/2008 to Vanderberg, et al.
Title: Beam current meter
Patent Number: 7,435,970 Issued on 10/14/2008 to Watanabe, et al.
Title: Method of manufacturing electrostatic deflector, and electrostatic deflector
Patent Number: 7,435,969 Issued on 10/14/2008 to Kametani, et al.
Title: Radiation detecting apparatus, radiation imaging apparatus and radiation imaging system
Patent Number: 7,435,968 Issued on 10/14/2008 to Watanabe, et al.
Title: X-ray detector with impact absorbing cover
Patent Number: 7,435,967 Issued on 10/14/2008 to Ertel, et al.
Title: X-ray detector
Patent Number: 7,435,966 Issued on 10/14/2008 to Vogtmeier, et al.
Title: X-ray detector and method for production of x-ray images with spectral resolution
Patent Number: 7,435,965 Issued on 10/14/2008 to Fuchs, et al.
Title: Thermal sensor with increased sensitivity
Patent Number: 7,435,964 Issued on 10/14/2008 to Lane, et al.
Title: Flow cell and methods of use thereof
Patent Number: 7,435,963 Issued on 10/14/2008 to Berry, et al.
Title: Imaging device and method for producing an infrared filtered digital image
Patent Number: 7,435,962 Issued on 10/14/2008 to Oon, et al.
Title: Imaging sensor
Patent Number: 7,435,961 Issued on 10/14/2008 to Boie, et al.
Title: Charged particle beam apparatus
Patent Number: 7,435,960 Issued on 10/14/2008 to Suzuki, et al.
Title: Microstructured pattern inspection method
Patent Number: 7,435,959 Issued on 10/14/2008 to Sasajima, et al.
Title: Electron beam apparatus and method for production of its specimen chamber
Patent Number: 7,435,958 Issued on 10/14/2008 to Inanobe, et al.
Title: Charged particle beam equipment and charged particle microscopy
Patent Number: 7,435,957 Issued on 10/14/2008 to Inada, et al.
Title: Apparatus and method for inspection and testing of flat panel display substrates
Patent Number: 7,435,956 Issued on 10/14/2008 to Parker
Title: Scanning probe microscope control system
Patent Number: 7,435,955 Issued on 10/14/2008 to West
Title: Electron microscope, methods to determine the contact point and the contact of the probe
Patent Number: 7,435,954 Issued on 10/14/2008 to Nien, et al.
Title: Quadrupole mass filter length selection
Patent Number: 7,435,953 Issued on 10/14/2008 to Freeouf
Title: Integrated analytical device
Patent Number: 7,435,952 Issued on 10/14/2008 to Finlay, et al.
Title: Ion source sample plate illumination system
Patent Number: 7,435,951 Issued on 10/14/2008 to Truche, et al.
Title: Micromachined field asymmetric ion mobility filter and detection system
Patent Number: 7,435,950 Issued on 10/14/2008 to Miller, et al.
Title: Mass spectrometric analysis method and system using the method
Patent Number: 7,435,949 Issued on 10/14/2008 to Ohtake, et al.
Title: Adherence of a solid-state image-sensing device to a substrate
Patent Number: 7,435,948 Issued on 10/14/2008 to Narita, et al.
Title: Apparatus and methods for integrating encoding functions in material placement machines
Patent Number: 7,435,947 Issued on 10/14/2008 to Engelbart, et al.
Title: Mark detector using multiple light beams for use in a displacement detector and an image forming apparatus
Patent Number: 7,435,946 Issued on 10/14/2008 to Kudo, et al.
Oscillation circuit and operation method thereof Number:7,119,626 from the United States Patent and Trademark Office (PTO) owispatent |
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