Title: Self-calibrating electrical test probe
Abstract: A self-calibrating test probe system of the present invention does not require probing head removal and replacement. Using the system of the present invention, the test probe and/or the entire system (including a testing instrument) may be calibrated or may self-calibrate while the probing head remains connected to an electrical component under test. The self-calibrating electrical testing probe system includes calibration circuitry including at least one input resistor, at least one relay, and at least one known calibration reference signal. If the test probe is an active test probe, the calibration circuitry may also include at least one amplifier. Each relay has a first position that provides signal access to a testing signal from an electrical component under test and a second position that provides signal access to the known calibration reference signal. Using the present invention, the error of the test probe and/or system is determined and compensated. Exemplary methods by which error compensation may be provided includes, for example, amplifying the testing signal, creating a correction table of correction values and adding an appropriate value from the correction table, or mathematically compensating.
Patent Number: 6,870,359 Issued on 03/22/2005 to Sekel
| Inventors:
|
Sekel; Stephen Mark (Camas, WA)
|
| Assignee:
|
Le Croy Corporation (Chestnut Ridge, NY)
|
| Appl. No.:
|
321422 |
| Filed:
|
December 16, 2002 |
| Current U.S. Class: |
324/158.1; 324/73.1 |
| Intern'l Class: |
G01R 031//00 |
| Field of Search: |
324/121 R,158.1,74,130,115,754-762,72.5
702/85,90-91
|
References Cited [Referenced By]
U.S. Patent Documents
| 4364027 | Dec., 1982 | Murooka | 341/120.
|
| 4743844 | May., 1988 | Odenheimer et al. | 324/121.
|
| 5235268 | Aug., 1993 | Harthcock | 324/115.
|
| 5248933 | Sep., 1993 | Venditti | 324/74.
|
| 5262716 | Nov., 1993 | Gregory et al. | 324/754.
|
| 5920187 | Jul., 1999 | Cosgrove et al.
| |
| 6351112 | Feb., 2002 | Felps et al.
| |
Other References
TEKTRONIX, User Manual: TDS 520A, 524A, 540A, & 544A Digitizing
Oscilloscopes, 1993, pp. 1-6, 2-4, 3-104 to 3-111, and 3-138-3-139.
|
Primary Examiner: Nguyen; Vinh P.
Attorney, Agent or Firm: Law Office of Karen Dana Oster, LLC
Claims
What is claimed is:
1. A self-calibrating electrical testing probe system comprising:
(a) a test probe comprising:
(i) a cable having a first cable end and a second cable end;
(ii) a probing head associatable with said first cable end; and
(iii) a connector associatable with said second cable end; and
(b) calibration circuitry at least partially located in said test probe,
said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one amplifier;
(iii) at least one relay; and
(iv) at least one known calibration reference voltage;
(c) wherein said test probe may be calibrated while it remains connected to
an electrical component under test.
2. The system of claim 1 further comprising a testing instrument.
3. The system of claim 2 wherein said testing instrument is an
oscilloscope.
4. The system of claim 2 wherein said connector is integral with said
testing instrument.
5. The system of claim 1 wherein said at least one relay is functionally
positioned behind said at least one input resistor.
6. The system of claim 1 wherein said at least one relay is functionally
positioned in front of said at least one input resistor.
7. The system of claim 1 wherein said calibration reference voltage may be
positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
8. The system of claim 1 wherein said electrical testing probe system may
self-calibrate said test probe.
9. The system of claim 1 wherein said electrical testing probe system may
self-calibrate said test probe in response to at least one condition
selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
10. A self-calibrating test probe system comprising:
(a) a testing instrument;
(b) a test probe having a probing head at a first end and a connector at a
second end, said connector associatable with said testing instrument; and
(c) calibration circuitry at least partially located in said test probe,
said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one amplifier;
(iii) at least one relay; and
(iv) at least one known calibration reference voltage;
(d) wherein said test probe system self-calibrates while it remains
connected to an electrical component under test.
11. The system of claim 10 wherein said testing instrument is an
oscilloscope.
12. The system of claim 10 wherein said connector is integral with said
testing instrument.
13. The system of claim 10 wherein said at least one relay is functionally
positioned behind said at least one input resistor.
14. The system of claim 10 wherein said at least one relay is functionally
positioned in front of said at least one input resistor.
15. The system of claim 10 wherein said calibration reference voltage may
be positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
16. The system of claim 10 wherein said electrical testing probe system may
be calibrated while said test probe remains connected to said electrical
component under test.
17. The system of claim 10 wherein said electrical testing probe system may
self-calibrate in response to at least one condition selected from the
group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
18. A method for self-calibrating an electrical testing probe, said method
comprising:
(a) providing a testing instrument;
(b) providing a test probe having at least one relay having a relay input;
(c) toggling said at least one relay to disconnect the relay input from a
testing signal and connect said relay input to a known calibration
reference source;
(d) applying a known calibration reference signal from said known
calibration reference source to said test probe, said known calibration
reference source having an associated expected signal;
(e) testing said known calibration reference signal applied to said test
probe to obtain a measured signal;
(f) comparing said measured signal with said expected signal, the
difference between said measured signal and said expected signal being a
measured error; and
(g) providing compensation for said measured error.
19. The method of claim 18, said electrical test probe remaining connected
to an electrical component under test throughout steps (c)-(g).
20. The method of claim 18, said electrical testing probe system performing
said steps (c)-(g) as a self-calibration routine.
21. The method of claim 18 said step of providing compensation for said
measured error further comprising the compensation step selected from the
group consisting of:
(a) amplifying said testing signal to compensate for said measured error;
(b) creating a correction table of correction values and adding an
appropriate value from said correction table to compensate for said
measured error; and
(c) compensating mathematically for said measured error.
22. The method of claim 18, further comprising the step of determining an
input resistor error.
23. The method of claim 22, further comprising the step of providing
compensation for said input resistor error.
24. The method of claim 18, further comprising the step of determining a
testing instrument error.
25. The method of claim 24, further comprising the step of providing
compensation for said testing instrument error.
26. The method of claim 18, said electrical testing probe system performing
steps (c)-(g) in response to at least one condition selected from the
group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
27. A self-calibrating electrical testing probe system comprising:
(a) a test probe;
(b) calibration circuitry at least partially located in said test probe,
said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one relay; and
(iii) at least one known calibration reference signal; and
(c) said at least one relay having a first position and a second position:
(i) said first position providing signal access to a testing signal from an
electrical component under test; and
(ii) said second position providing signal access to said known calibration
reference signal;
(d) wherein said test probe may be calibrated while it remains connected to
said electrical component under test.
28. The system of claim 27 further comprising an error compensator.
29. The system of claim 28 wherein said error compensator toggles said at
least one relay between said first and second positions to disconnect the
relay input from a testing signal and connect the relay input to a known
calibration reference source.
30. The system of claim 28 wherein said error compensator provides
compensation for a measured error.
31. The system of claim 27 further comprising a testing instrument.
32. The system of claim 27, wherein said test probe is an active test
probe, said calibration circuitry further comprising at least one
amplifier.
33. The system of claim 27 wherein said at least one relay is functionally
positioned behind said at least one input resistor.
34. The system of claim 27 wherein said at least one relay is functionally
positioned in front of said at least one input resistor.
35. The system of claim 27 wherein said calibration reference voltage may
be positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
36. The system of claim 27 wherein said electrical testing probe system may
self-calibrate said test probe.
37. The system of claim 27 wherein said electrical testing probe system may
self-calibrate said test probe in response to at least one condition
selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
Description
The present application is a nonprovisional of U.S. Provisional Patent
Application Ser. No. 60/340,496, filed Dec. 14, 2001. The present
application is based on and claims priority from this provisional
application, the disclosure of which is hereby incorporated herein by
reference.
BACKGROUND OF INVENTION
The present invention relates generally to electrical test probes for
making contact between electrical components and testing instruments and,
more specifically to a self-calibrating differential electrical testing
probe.
An electrical test probe 18 generally consists of a probing head 20, a
cable 22, and a scope interface (hereinafter, "connector 24"). The probing
head 20 may have an integral or replaceable probing tip 26 or other test
probe input that is suitable for making an electronic contact with
electrical components. The probing head 20 is attached to a first end of
the cable 22 and the connector 24 is attached to a second, opposite end of
the cable 22.
Test probes are often used to provide an electrical connection between
electrical components 28 (e.g. a component lead, wire, circuit board
trace, electrical contact, or other component such as those located on a
circuit board) and testing instruments 30 (e.g. oscilloscopes, voltmeters,
and signal measuring instruments). The electrical connection is made by
attaching the connector 24 at the second end of the cable 22 to a testing
instrument 30 and using the probing head 20 (and usually an integral or
replaceable probing tip 26) at the first end to touch, grip, permanently
attach, semi-permanently attach (e.g. soldering), plug into, or otherwise
make contact with an electrical component 28. It should be noted that the
connector 24 may be integral with the testing instrument 30. As an
electrical component 28 is probed with a test probe, the signal flowing
through the electrical component 28 registers on the testing instrument
30.
In order to provide correct measurements, testing instruments 30 should be
calibrated as accurately as possible. The calibration that is generally
used in instruments that measure amplitude improves accuracy by
compensating for one or both of the gain and offset errors. Modern testing
instruments 30 can calibrate the entire signal path including the testing
instrument 30 and the test probe. The process of calibrating the entire
signal path can be described in two phases: calibration of the testing
instrument 30 and calibration of the test probe. As shown in FIG. 1,
calibration of the testing instrument 30 can be done automatically in that
it does not require user intervention. Exemplary testing instruments
capable of self-calibration include, for example, the LeCroy WavePro
series of digital oscilloscopes. As shown in FIG. 2, to calibrate the test
probe, the user must remove the probing head 20 from the electrical
component 28 (if the probing head 20 is attached to the electrical
component 28), attach the probing head 20 to a probe compensation port on
the testing instrument 30, and run the calibration routine. When
calibration is complete, the user may then reestablish a connection by
replacing the probing head 20 on the electrical component 28. Calibration
of the test probe, therefore, requires significant user intervention in
which the user must perform the manual step of attaching the probing head
20 to a probe compensation port before the actual calibration of the test
probe is performed by the testing instrument 30. To find the calibration
of the entire signal path, the information from the calibration of the
testing instrument 30 is combined with the information from the
calibration of the test probe.
Removing and replacing a probing head 20 from an electrical component 28 is
problematic because it is often difficult and/or time consuming to
accurately place, position, and hold the probing head 20 on the electrical
component 28. Further, removing and replacing a probing head 20 from an
electrical component 28 may cause damage to the electrical component 28.
For example, for sensitive components where the contact area is a soft
metal, each time a connection is made the metal may be braded or scraped
off. Future connections, therefore, would not be as accurate because the
contact would not be as complete. Removing the probing head 20 from the
electrical component 28, therefore, is undesirable.
Calibration may be done each time a test probe is connected to a testing
instrument 30, each time a testing instrument 30 is turned on, at
regularly timed intervals, when the instrument configuration changes, upon
a change in temperature, and/or at the user's request.
As mentioned, calibration may be done each time a test probe is connected
to a testing instrument 30. To replace a test probe, a user disconnects
the current test probe from the testing instrument 30. Then the user
connects a new test probe to a testing instrument 30. Test probes are
generally replaced when the user needs a new test probe with
characteristics that are appropriate for a particular use. The user may
also replace a test probe if the current test probe is malfunctioning.
Changing a test probe may change parameters such as attenuation,
capacitance, frequency response, component tolerances, manufacturing
variations, and other calibration variables. Calibrating particular
combinations of the testing instrument 30, the testing instrument channel,
and the test probe helps to obtain and maintain high measurement accuracy.
If in the process of connecting the test probe to the testing instrument
30 and/or the electrical component, the test probe breaks or other
calibration variables change, the known testing instruments 30 do not have
any provision to deal with this.
Calibration may also be performed each time a testing instrument 30 is
activated (e.g. turned on). Testing instruments 30 are generally turned
off when they are not in use and must be turned on again when they are to
be used. This may happen several times a day and each time the user must
remove the probing head 20 from the electrical component 28 and then
replace the probing head 20 back on the electrical component 28 when the
calibration is complete.
Calibration that is performed at regularly timed intervals (e.g. every two
hours), when the frame configuration changes, and/or upon a change in
temperature (e.g. when the ambient temperature changes more than 10
degrees C. from the temperature at the time of the last full calibration),
may also occur several times a day. At each instance of calibration, the
user must remove the probing head 20 from the electrical component 28 and
then replace the probing head 20 back on the electrical component 28 when
the calibration is complete.
To optimize the accuracy of a particular measurement, a user may also
request calibration. A user requested calibration again requiring the user
to remove the probing head 20 from the electrical component 28 and then
replace the probing head 20 back on the electrical component 28 when the
calibration is complete.
If calibration is performed several times a day, the added time and trouble
of removing the probing head 20 from the electrical component 28 and then
replacing the probing head 20 back on the electrical component 28 may
cause significant problems including added time, possible misconnections,
poor connections with the contact, and other undesirable consequences of
removal and replacement.
BRIEF SUMMARY OF THE INVENTION
Prior art methods required removal of the probing head from the electrical
component and then replacement of the probing head back on the electrical
component. The increased need for calibration of the test probe makes the
time, trouble, and problems of probing head removal and replacement more
relevant.
The present invention is directed to a self-calibrating test probe system
that does not require probing head removal and replacement. Using the
system of the present invention, the test probe may be calibrated or may
self-calibrate while the probing head remains connected to an electrical
component under test. Further, in one preferred embodiment of the system
of the present invention, the entire system (including the test probe and
a testing instrument) may be calibrated or may self-calibrate while the
probing head remains connected to an electrical component under test.
The self-calibrating electrical testing probe system of the present
invention preferably includes a test probe and calibration circuitry. The
calibration circuitry preferably includes at least one input resistor, at
least one relay, and at least one known calibration reference signal. If
the test probe is an active test probe, the calibration circuitry may also
include at least one amplifier. Each relay has a first position that
provides signal access to a testing signal from an electrical component
under test and a second position that provides signal access to the known
calibration reference signal. Using the present invention, the error of
the test probe and/or system is determined and compensated. Exemplary
methods by which the error compensator may provide error compensation
includes, for example, amplifying the testing signal, creating a
correction table of correction values and adding an appropriate value from
the correction table, or mathematically compensating.
The foregoing and other objectives, features, and advantages of the
invention will be more readily understood upon consideration of the
following detailed description of the invention, taken in conjunction with
the accompanying drawings.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
FIG. 1 is a schematic arrangement of a prior art testing instrument capable
of self-calibration of the testing instrument.
FIG. 2 is a schematic arrangement of a prior art testing instrument capable
of calibration of a test probe, but requiring the step of manual
attachment of the probing head of a test probe to a probe compensation
port on a testing instrument.
FIG. 3 is a schematic arrangement of an exemplary self-calibration system
of the present invention in which the probing head of a test probe may
remain connected to electrical components during the calibration process.
FIG. 4 is a schematic arrangement of an exemplary self-calibration system
of the present invention in which the probing head is a single-ended
probing head and the calibration reference voltage is in the connector.
FIG. 5 is a schematic arrangement of an exemplary self-calibration system
of the present invention in which the probing head is a single-ended
probing head and the calibration reference voltage is in the testing
instrument.
FIG. 6 is a circuit diagram of an exemplary probing head of the present
invention in a self-calibrating active single-ended probing head in which
the relay is positioned in front of the input attenuating network.
FIG. 7 is a circuit diagram of an exemplary probing head of the present
invention in a self-calibrating active single-ended probing head in which
a first relay is positioned in front of the input attenuating network and
a second relay is positioned behind the input attenuating network.
FIG. 8 is a circuit diagram of an exemplary self-calibrating passive
single-ended probing head of the present invention in which upper resistor
R of the input attenuating network is built into the probing head and
lower resistor R' of the input attenuating network is built into the
connector.
FIG. 9 is a circuit diagram of an exemplary self-calibrating passive
single-ended probing head of the present invention in which upper resistor
R of the input attenuating network is built into the probing head and
lower resistor R' of the input attenuating network is built into the
testing instrument.
FIG. 10 is a circuit diagram of an exemplary self-calibrating differential
probing head of the present invention in which the calibration reference
voltage is applied at the output of the attenuating resistor.
FIG. 11 is a circuit diagram of an exemplary self-calibrating differential
probing head of the present invention in which the calibration reference
voltage is in the probing head, the external relay being at the input.
FIG. 12 is a circuit diagram of an exemplary self-calibrating differential
probing head of the present invention incorporating a MEMs relay and in
which the calibration reference voltage is in the probing head.
DETAILED DESCRIPTION OF THE INVENTION
The present invention is directed to a self-calibrating test probe system.
Using the system of the present invention, the test probe 18 may be
calibrated or may self-calibrate while the probing head 20 remains
connected to an electrical component (or circuit) 28 under test. Further,
in one preferred embodiment of the system of the present invention, the
entire system (including the test probe 18 and a testing instrument 30)
may be calibrated or may self-calibrate while the probing head 20 remains
connected to an electrical component 28 under test. Because the test probe
18 may remain connected during this process, the necessity of having to
remove the probing head 20 from the electrical component 28 and then
replace the probing head 20 on the electrical component 28 is eliminated.
Eliminating the need to remove and replace the probing head 20 eliminates
significant problems including added time, possible misconnections, poor
connections with the contact, and other undesirable consequences of
removal and replacement.
As shown in FIG. 3, the present invention includes a test probe 18 having a
probing head 20, a cable 22, and a connector 24. The test probe 18 may be,
for example, a voltage probe, an active or passive probe, a single ended
or differential probe, a resistive divider probe (or low capacitance or
Z.sub.0 probe), or other known probe. The probing head 20 may have an
integral or replaceable probing tip 26 that is suitable for making an
electronic contact with electrical components 28. The probing head 20 is
attached to a first end of the cable 22 and the connector 24 is attached
to a second, opposite end of the cable 22.
FIG. 3 also shows a testing instrument 30 of the present invention that may
be, for example, an oscilloscope, a voltmeter, or another signal measuring
instrument. The test probe 18 may be used to provide an electrical
connection between electrical components 28 and the testing instrument 30.
If a particular testing instrument 30 has more than one channel, the
present invention may be implemented for each channel. It should be noted
that the connector 24 of the test probe 18 may be integral with the
testing instrument 30.
As shown in FIG. 3, the probing head 20 (including an integral and/or
replaceable probing tip 26) is connected to the electrical component 28.
During the calibration process of the present invention, there is no need
to remove and/or reattach the probing head 20. It should be noted,
however, that calibration could be done using the present invention even
if the probing head 20 was not attached to an electrical component 28. For
example, the probing head 20 could be laying on a table or being held by
the user. Further, the testing instrument 30 could be calibrated (but not
the test probe 18) if the test probe 18 was not attached to the testing
instrument 30. Still further, if a test probe that did not include the
circuitry of the present invention was attached to the testing instrument
30, the testing instrument 30 could still be calibrated (but not the test
probe).
The present invention is accomplished by the realization of the advantages
of not having to remove the probing head 20 from the electrical component
28 and then replace the probing head 20 on the electrical component 28
after calibration. Recent technologies such as the MicroElectroMechanical
(MEM) relay, and other micro-miniaturized technologies allow the geometry
of components to be shrunk. This reduces the parasitic capacitance and
inductance so that they are minimal. Certain embodiments that might have
been cumbersome using older technologies are now very manageable. It
should be noted, however, that the present invention could be implemented
using traditional or older technology components. For example, an
electromechanical relay may be replaced with a switching element or
electronic equivalents such as FETs or PIN diodes.
The present invention preferably includes components such as at least one
input resistor 38, at least one amplifier 40, at least one relay 42, and a
known calibration reference voltage (V.sub.CAL) 44. As will be discussed
below, depending on the embodiment, some of the components may be omitted
(e.g. an amplifier is not needed in a passive probe) and the placement of
the components may be varied.
Turing first to the input resistor 38, for exemplary purposes, the present
invention is shown with an input attenuating network 38 at the front of
the probing head 20. FIGS. 4-7 show a single-ended probing head 20 with a
divider resistor as the input resistor 38. FIG. 8 shows an alternative
embodiment in which the lower resistor R' is built into the connector 24.
FIG. 9 shows another alternative embodiment in which the lower resistor R'
is built into the testing instrument 30. FIGS. 10-12 show exemplary
differential probing heads 20 with two sets of input resistors 38 (one
input resistor set is in the phantom box 38 and the other input resistor
set is comprised of the remaining resistors R and R'). The input
attenuating network 38 may have a variable resistance.
The test probe amplifier 40 may be, for example, either discrete or
integrated into a monolithic integrated circuit. As shown in the
embodiment of FIG. 12, the amplifier 40 may be configured to include one
or more additional relay 42. An amplifier 40 may be eliminated in a
passive probe embodiment such as those shown in FIGS. 8 and 9. Further,
there may be more than one amplifier. Still further, the amplifier may be
discrete or integrated.
A relay 42 may be used to connect the calibration reference voltage 44 to
the test probe input 26. Each relay 42 has a first position and a second
position. The first position providing signal access to the testing signal
from an electrical component 28 under test. The second position providing
signal access to the known calibration reference signal 44. In a
differential probing head 20 having two test probe input(s) 26, each test
probe input may have an associated relay 42 to connect it to the
calibration reference voltage 44. Relay 42 may be, for example, an
electromechanical relay, a switching element, or an electronic equivalent
of a relay (e.g. FETs or PIN diodes). Further, depending on the bandwidth
of the probes, either electromechanical relays or solid-state relays (e.g.
FETs). If, for example, the amplifier is a monolithic integrated circuit,
the relays may be MOSFETS or JFETS integrated on the die. The selection of
switch technology may be determined, therefore, by the performance needs
of the amplifier.
The calibration reference voltage 44 may be positioned in the probing head
20 (FIGS. 6-7), in the connector 24 (FIGS. 4 and 8), or in the testing
instrument 30 (FIGS. 5 and 9). The calibration reference voltage 44 can be
generated in a digital to analog converter (DAC), or by other means. The
advantage to having the calibration reference voltage 44 positioned in the
probing head 20 or in the connector 24 is that the probe will work on any
testing instrument 30 (i.e. testing instrument independent) and that the
calibration reference voltage 44 could be easily replaced if it is damaged
or inaccurate. An advantage to having the calibration reference voltage 44
positioned in the testing instrument 30 is that the testing instrument 30
can control the calibration reference voltage 44 with the internal
calibration of the testing instrument 30. In some situations, being able
to control the calibration reference voltage 44 with the internal
calibration of the testing instrument 30 may give greater system accuracy.
Although the term calibration reference voltage is used throughout this
specification, for an alternative type of probe the appropriate
calibration reference signal would be applied. Although the term
"calibration reference voltage" is used in its singular form throughout
this specification, it should be noted that the calibration reference
signal might be a variable signal that may be set, for example to 0 volts,
which is necessary for offset calibration.
FIG. 3 also shows an error compensator 50 that may be implemented as
hardware, software, or a combination of hardware and software. The error
compensator 50 may be implemented as part of a microcomputer that controls
the testing instrument 30. The error compensator 50 may perform multiple
functions (e.g. steps of methods as discussed below) and may have separate
components for each function. For example, if the error compensator 50
controls the operation of the relay 42, a separate relay control module
may control the actual operation. Exemplary methods by which the error
compensator 50 may provide error compensation includes, for example,
amplifying the testing signal with a variable gain amplifier, creating a
correction table of correction values and adding an appropriate value from
the correction table, or mathematically compensating. Although shown in
the testing instrument 30, the error compensator 50 may also be positioned
in the test probe 18, in an external module, or spread between more than
one of the various possible positions.
To calibrate the system, the relay 42 toggles to disconnect the input from
the user's testing signal and connect the input to a known calibration
reference voltage 44. If the signal path between the test probe input and
the amplifier circuit is an input attenuating network, it is not necessary
to break the input connection during the calibration cycle.
Description of Exemplary Embodiments
The following paragraphs detail the exemplary embodiments shown in FIGS.
4-12. It should be noted that these embodiments are meant to be exemplary
and alternate embodiments are possible as discussed throughout this
specification. For example, combining features shown in the drawings, even
if the specific combination is not shown, would be included in the present
invention.
FIGS. 4 and 5 are schematic arrangements of an exemplary self-calibration
system in which the probing head 20 is a single-ended probing head and the
calibration reference voltage 44 is in the test probe 18 (FIG. 4 shows it
in the connector 24) and the testing instrument 30 (FIG. 5). In this
embodiment, the relay 42 is positioned behind the input resistor 38 and in
front of the amplifier 40. Positioning the relay 42 behind the input
resistor 38 creates a probing head 20 embodiment that works well at high
frequencies and does not have the problems with parasitic capacitance and
inductance of the relay contacts that may be present in other embodiments.
Because the relay 42 is positioned behind the input resistor 38, the input
resistor 38 is not truly calibrated. Often the errors in the input
resistor 38 are minimal and no compensation is necessary. One method,
however, for dealing with or compensating for the errors in the input
resistor 38 would be to measure the gain and offset errors for the input
resistor 38 at the factory so that the measured error may be incorporated
in the calibration routine. As the errors in the input resistor 38 tend to
be relatively constant, this is a reasonable means for compensating for
these errors. Another method, however, for dealing with or compensating
for the errors in the input resistor 38 would be to make the errors
minimal by using an input resistor 38 that has been laser trimmed. It
should be noted that the calibration reference voltage 44 may be
positioned elsewhere, such as in the probing head 20. Using the schematic
arrangement shown in this figure, the entire system, including the test
probe 18 and the testing instrument 30, may be calibrated or may
self-calibrate while the probing head 20 remains connected to an
electrical component 28, as it is not necessary to break the input
connection during the calibration cycle.
FIG. 6 is a circuit diagram of an exemplary self-calibrating active
single-ended probing head 20 in which the relay 42 is positioned in front
of the input attenuating network 38. This configuration is the ideal
position for relay 42 because the entire test probe 18, including the
input resistor 30 is truly calibrated. Based on current technologies, this
configuration would most likely be more useful in a slower, lower
frequency test probe 18 where parasitic capacitance and inductance of the
relay contacts are not a significant issue. If the present invention is
implemented for lower frequency test probes 18, the invention may be
implemented using solid state (FET) relays 42. Using current technology,
for a faster, higher frequency test probe 18 the relay 42 is preferably
positioned on the IC as is shown in FIGS. 4 and 5. The inventor of the
present invention recognizes the advantages to this configuration and, if
technology advances, would attempt to implement this configuration for a
faster test probe 18. Accordingly, it is within the scope of the present
invention to position the relay 42 in front of the input resistor 38 for
faster, higher frequency test probes 18. It should be noted that the
calibration reference voltage 44 might be positioned, for example,
anywhere in the test probe 18 or in the testing instrument 30. Using the
schematic arrangement shown in this figure, the entire system, including
the test probe 18 and the testing instrument 30, may be calibrated or may
self-calibrate while the probing head 20 remains connected to an
electrical component 28, as it is not necessary to break the input
connection during the calibration cycle.
FIG. 7 is a circuit diagram of an exemplary self-calibrating active
single-ended probing head 20 in which a first relay 42 is positioned in
front of the input attenuating network 38 and a second relay 42 is
positioned in behind the input attenuating network 38 and in front of the
amplifier 40. This configuration may be implemented so that the first
relay 42 is used when measuring a slower, lower frequency test probe 18
and the second relay 42 is used when measuring a faster, higher frequency
test probe 18. The inventor of the present invention recognizes the
advantages to this configuration and, if technology advances, would
attempt to implement this configuration for a mixed-use test probe 18.
Accordingly, it is within the scope of the present invention to position a
first relay 42 in front of the input attenuating network 38 and a second
relay 42 behind the input attenuating network 38 and in front of the
amplifier 40. It should be noted that the calibration reference voltage 44
might be positioned, for example, in the test probe 18 or in the testing
instrument 30. It should also be noted, that although it is not shown,
this configuration may be implemented in alternative embodiments (e.g. in
a differential probe). Using the schematic arrangement shown in this
figure, the entire system, including the test probe 18 and the testing
instrument 30, may be calibrated or may self-calibrate while the probing
head 20 remains connected to an electrical component 28, as it is not
necessary to break the input connection during the calibration cycle.
FIGS. 8 and 9 show exemplary implementations of the present invention as
passive probes. Passive probes are often desirable because they provide an
inexpensive alternative device to acquire signals that is convenient,
rugged, and accurate over a wide dynamic range. FIG. 8 is a circuit
diagram of an exemplary self-calibrating passive single-ended probing head
20 in which upper resistor R of the input attenuating network is built
into the probing head and lower resistor R' of the input attenuating
network is built into the connector. FIG. 9 is a circuit diagram of an
exemplary self-calibrating passive single-ended probing head of the
present invention in which upper resistor R of the input attenuating
network is built into the probing head and lower resistor R' of the input
attenuating network is built into the testing instrument. In comparison to
FIGS. 8 and 9, the other embodiments (e.g. those shown in FIGS. 4-7 and
10-12) are shown with the input attenuating network 38 built into the
probing head 20. It should be noted that the calibration reference voltage
44 might be positioned, for example, in the test probe 18 or in the
testing instrument 30. It should also be noted, that although it is not
shown, the passive mode embodiment may be implemented in alternative
embodiments (e.g. in a differential probe). Using the schematic
arrangement shown in this figure, the entire system, including the test
probe 18 and the testing instrument 30, may be calibrated or may
self-calibrate while the probing head 20 remains connected to an
electrical component 28, as it is not necessary to break the input
connection during the calibration cycle.
FIG. 10 is a circuit diagram of an exemplary self-calibrating differential
probing head 20 in which the calibration reference voltage 44 is in the
probing head 20. It should be noted that only one input resistor (R and
R') is shown in phantom box 38, but the second input resistor 38 includes
the remaining resistors R and R'. To maintain good common mode rejection,
in the preferred embodiment, the connections to both relays should be
identical in geometries, balancing the parasitic capacitance and
inductance. Similar to the embodiments shown in FIGS. 4 and 5, in this
embodiment the relays 42 are functionally positioned behind the input
resistors 38 and in front of the amplifier 40. As mentioned above,
positioning the relays 42 behind the input resistors 38 creates a probing
head 20 embodiment that works well at high frequencies. As was also
discussed, because the relays 42 are positioned behind the input resistors
38, the input resistors 38 are not truly calibrated. The errors in the
input resistor 38 may be dealt with as discussed above for the embodiments
of FIGS. 4 and 5. It should be noted that under certain circumstances,
when using this embodiment a voltage signal may come out of the test probe
inputs 26 during the calibration cycle. Accordingly, use of this
embodiment should be limited to circuits which would not be adversely
effected by the voltage signal. On the other hand, if the signal path
between the test probe inputs 26 and the amplifier circuit 40 is an input
attenuating network 38, it is not necessary to break the input connection
during the calibration cycle. It should also be noted that the calibration
reference voltage 44 may be positioned elsewhere, such as in the connector
24 or in the testing instrument 30. Using the schematic arrangement shown
in this figure, the entire system, including the test probe 18 and the
testing instrument 30, may be calibrated or may self-calibrate while the
probing head 20 remains connected to an electrical component 28 as it is
not necessary to break the input connection during the calibration cycle.
FIG. 11 is a circuit diagram of an exemplary self-calibrating differential
probing head 20 in which the calibration reference voltage 44 is in the
probing head 20, the external relay being at the input. It should be noted
that only one input resistor (R and R') is shown in phantom box 38, but
the second input resistor 38 includes the remaining resistors R and R'. To
maintain good common mode rejection, in the preferred embodiment, the
connections to both relays should be identical in geometries, balancing
the parasitic capacitance and inductance. Similar to the embodiment shown
in FIG. 6, the relays 42 are positioned in front of the input attenuating
networks 38. This configuration is the ideal position for relay 42 because
the entire test probe 18, including the input resistors 30 are truly
calibrated. The same limitations as were discussed for the embodiment of
FIG. 6 would be applicable for this embodiment. It should be noted that
the calibration reference voltage 44 might be positioned, for example,
anywhere in the test probe 18 or in the testing instrument 30. Using the
schematic arrangement shown in this figure, the entire system, including
the test probe 18 and the testing instrument 30, may be calibrated or may
self-calibrate while the probing head 20 remains connected to an
electrical component 28, as it is not necessary to break the input
connection during the calibration cycle.
FIG. 12 is a circuit diagram of an exemplary self-calibrating differential
probing head 20 incorporating MEMs relays and in which the calibration
reference voltage 44 is in the probing head 20. Specifically, FIG. 12
shows an amplifier 40 with MEMs relays 42 incorporated on an IC. Using
these types of miniaturized components, parasitic elements are
substantially insignificant. It should be noted that only one input
resistor (R and R') is shown in phantom box 38, but the second input
resistor 38 includes the remaining resistors R and R'. To maintain good
common mode rejection, in the preferred embodiment, the connections to
both relays should be identical in geometries, balancing the parasitic
capacitance and inductance. Similar to the embodiments shown in FIGS. 4,
5, and 10, in this embodiment the relays 42 are functionally positioned
behind the input resistors 38 and the advantages and disadvantages
discussed relating thereto applies for the embodiment shown in this
figure. Most of the other embodiments may be implemented by incorporating
a MEMs relays 42 as shown in this figure. It should be noted that the
calibration reference voltage 44 might be positioned, for example,
anywhere in the test probe 18 or in the testing instrument 30. Using the
schematic arrangement shown in this figure, the entire system, including
the test probe 18 and the testing instrument 30, may be calibrated or may
self-calibrate while the probing head 20 remains-connected to an
electrical component 28, as it is not necessary to break the input
connection during the calibration cycle.
Exemplary Method for Using the Present Invention
As mentioned above, to calibrate the system, the relay 42 toggles to
disconnect the input from the user's testing signal and connect the input
to a known calibration reference voltage 44. If the signal path between
the test probe input and the amplifier circuit is an input attenuating
network, it is not necessary to break the input connection during the
calibration cycle. The following is an exemplary method for using a test
probe 18 incorporating the present invention. The method may be modified
based on the embodiment. For example, although the relay 42 and input
resistor 38 are used in their singular form, there would be two relays 42
and two input resistors 38 in a differential probe. It should be noted
that some or all of the steps may be performed by the error compensator
50.
During the calibration process of the present invention, there is no need
to remove and/or reattach the probing head 20 to an electrical component
28. It should be noted, however, that calibration could be done using the
present invention even if the probing head 20 was not attached to an
electrical component 28. Instead, the test probe 18 at least one relay 42
toggles to disconnect the relay 42 input from a testing signal and connect
the relay 42 input to a known calibration reference source 44.
Once the relay 42 has toggled to the known calibration reference source 44,
the system applies a known calibration reference signal from the known
calibration reference source 44 to the test probe 18. The known
calibration reference signal has an associated expected signal.
The system then tests the known calibration reference signal applied to the
test probe 18 to obtain a measured signal. The measured signal is then
compared with the expected signal to find the difference therebetween. The
difference between the measured signal and the expected is the test probe
18 measured error.
Compensation for the test probe 18 measured error may then be provided by
known compensation methods. For example, the test probe 18 measured error
may be compensated for by amplifying the testing signal, creating a
correction table of correction values and adding an appropriate value from
the correction table, or mathematically compensating.
In calibrating the entire system, in addition to the test probe 18 measured
error, there may be additional errors for which compensation is needed.
For example, the input resistor 38 error and the testing instrument 30
error may also require compensation.
Input resistor 38 error may be present in test probes in which the relay 42
is positioned behind the input resistor 38 (e.g. embodiments shown in
FIGS. 4, 5, and 10). As the input resistor 38 error is often minimal, no
compensation may be necessary. One method, however, for dealing with or
compensating for the input resistor 38 error would be to measure the gain
and offset errors for the input resistor 38 at the factory so that the
input resistor 38 error may be incorporated in the calibration routine. As
the input resistor 38 error tends to be relatively constant, this is a
reasonable means for compensating for these errors. Another method,
however, for dealing with or compensating for the input resistor 38 error
would be to make the error minimal by using an input resistor 38 that has
been laser trimmed.
It should be noted that the entire system may be measured so as to
eliminate the necessity of performing mathematical computations. For
example, if the known calibration reference signal were applied such that
it flows through both the testing instrument 30 and the test probe 18 the
entire system would be measured at the same time and the need for
performing mathematical computations would be eliminated.
Testing instrument 30 error is generally the gain and offset errors of the
testing instrument 30. Testing instrument 30 error may be measured using
known methods.
Once the correction factors (e.g. the test probe 18 measured error, the
input resistor 38 error, and the testing instrument 30 error) are
determined, they can be used for the full test probe calibration.
Specifically, one method for compensating for the correction factors may
be to amplify the testing signal to compensate for the correction factors.
(For example, correction voltages can be applied as needed to drive the
output of the amplifier to the expected voltage.) Another method for
compensating for the correction factors may be to create a correction
table of correction values and then add an appropriate value from the
correction table to compensate for the correction factors. Yet another
method for compensating for the correction factors may be to
mathematically compensate for the correction factors.
The method of the present invention may be performed as part of a
self-calibration routine. The self-calibration routine may be performed in
response to conditions such as a test probe being connected to a testing
instrument, a test probe being disconnected to a testing instrument, a
testing instrument being turned on or off, at regularly timed intervals,
when a instrument configuration changes, upon an increase or decrease in
temperature, or upon a user's request.
The terms and expressions that have been employed in the foregoing
specification are used as terms of description and not of limitation, and
are not intended to exclude equivalents of the features shown and
described or portions of them. The scope of the invention is defined and
limited only by the claims that follow.
*
