Title: Surface acoustic wave filter apparatus having different structure reflectors
Abstract: A surface acoustic wave filter apparatus includes extensional-coupling-resonator-mode first through fourth SAW filter devices which are disposed on a piezoelectric substrate. Each SAW filter device includes three interdigital transducers (IDTs) arranged in a SAW propagating direction, and reflectors arranged such that they sandwich the IDTs therebetween. The SAW filter devices have a balanced-to-unbalanced input/output function. The reflectors of the first and second SAW filter devices are different from those of the third and fourth SAW filter devices in at least one of the number, the pitch, the duty, and the thickness of the electrode fingers of the reflectors.
Patent Number: 6,891,451 Issued on 05/10/2005 to Sawada
| Inventors:
|
Sawada; Yoichi (Ishikawa-ken, JP)
|
| Assignee:
|
Murata Manufacturing Co., Ltd. (Kyoto, JP)
|
| Appl. No.:
|
123452 |
| Filed:
|
April 17, 2002 |
Foreign Application Priority Data
| Apr 18, 2001[JP] | 2001-119963 |
| Current U.S. Class: |
333/195; 310/313R; 333/193 |
| Intern'l Class: |
H03H 009/64 |
| Field of Search: |
333/193-196,133
310/313. R,313. B,313. C,313. D
|
References Cited [Referenced By]
U.S. Patent Documents
| 5392013 | Feb., 1995 | Yamamoto et al.
| |
| 5568002 | Oct., 1996 | Kawakatsu et al.
| |
| 5844453 | Dec., 1998 | Matsui et al.
| |
| 5936488 | Aug., 1999 | Taguchi et al.
| |
| 5963114 | Oct., 1999 | Ueda et al.
| |
| 6366179 | Apr., 2002 | Kuroda.
| |
| 6483402 | Nov., 2002 | Endoh et al.
| |
| Foreign Patent Documents |
| 479402 | Mar., 2002 | CN.
| |
| 04-054011 | Feb., 1992 | JP.
| |
| 7-131291 | May., 1995 | JP.
| |
| 10-117123 | May., 1998 | JP.
| |
| 10-261935 | Sep., 1998 | JP.
| |
| 2001/-267885 | Sep., 2001 | JP.
| |
Other References
G. Endoh, M. Ueda, O. Kawachi and Y. Fujiwara, "High Performance Balanced Type
SAW Filters in the Range of 900MHz and 1.9 GHz"; Proceedings of 1997 IEEE Ultrasonics
Symposium, 1997, p. 41-44.
|
Primary Examiner: Nguyen; Minh
Attorney, Agent or Firm: Keating & Bennett LLP
Claims
1. A surface acoustic wave filter apparatus comprising:
a piezoelectric substrate;
a surface acoustic wave unit disposed on said piezoelectric substrate, said surface
acoustic wave unit provided with a balanced-to-unbalanced conversion function,
the surface acoustic wave unit including a plurality of surface acoustic wave filter
devices, each of the plurality of surface acoustic wave devices including:
a plurality of interdigital transducers arranged in a direction in which a surface
acoustic wave propagates; and
a set of two reflectors disposed at opposite ends of the plurality of interdigital
transducers; wherein
the structure of a first set of two reflectors is different from the structure
of a second set of two reflectors; and
at least one of the number, the pitch, the duty, and the thickness of electrode
fingers of the first and second sets of two reflectors is different from each other.
2. A surface acoustic wave filter apparatus according to claim 1, wherein each
set of two reflectors of each of the plurality of interdigital transducers is different
from the sets of two reflectors of the others of the plurality of interdigital transducers.
3. A surface acoustic wave filter apparatus according to claim 1, wherein the
piezoelectric substrate is a LiTaO
3 piezoelectric substrate.
4. A communication apparatus comprising the surface acoustic wave filter apparatus
according to claim 1.
5. A surface acoustic wave filter apparatus comprising:
a piezoelectric substrate;
a first surface acoustic wave filter device disposed on the piezoelectric substrate
and including a plurality of interdigital transducers arranged in a direction in
which a surface acoustic wave propagates, and reflectors arranged so as to sandwich
the plurality of interdigital transducers therebetween:
a second surface acoustic wave filter device disposed on the piezoelectric substrate
and including a plurality of interdigital transducers arranged in a direction in
which a surface acoustic wave propagates, and reflectors arranged so as to sandwich
the plurality of interdigital transducers therebetween transmission phase characteristics
of said second surface acoustic wave filter device being 180° out of phase
with transmission phase characteristics of said first surface acoustic wave filter
device;
an unbalanced terminal for electrically connecting one terminal of said first
surface acoustic wave filter device in parallel to one terminal of said second
surface acoustic wave filter device; and
balanced terminals for electrically connecting the other terminal of said first
surface acoustic wave filter device to the other terminal of said second surface
acoustic wave filter device; wherein
the structure of the reflectors of said first surface acoustic wave filter device
is different from the structure of the reflectors of said second surface acoustic
wave filter device.
6. A surface acoustic wave filter apparatus according to claim 5, wherein the
reflectors of said first surface acoustic wave filter device are different from
the reflectors of said second surface acoustic wave filter device in at least one
of the number, the pitch, the duty, and the thickness of electrode fingers of the reflectors.
7. A surface acoustic wave filter apparatus according to claim 5, wherein the
piezoelectric substrate is a LiTaO
3 piezoelectric substrate.
8. A communication apparatus comprising the surface acoustic wave filter apparatus
according to claim 5.
9. A surface acoustic wave filter apparatus comprising:
a piezoelectric substrate;
first, second, and third surface acoustic wave filter devices disposed on the
piezoelectric substrate, each of said first, second, and third surface acoustic
wave filter devices including a plurality of interdigital transducers arranged
in a direction in which a surface acoustic wave propagates, and reflectors arranged
so as to sandwich the plurality of interdigital transducers therebetween;
a fourth surface acoustic wave filter device disposed on the piezoelectric substrate
and including a plurality of interdigital transducers arranged in a direction in
which a surface acoustic wave propagates, and reflectors arranged so as to sandwich
the plurality of interdigital transducers therebetween, transmission phase characteristics
of said fourth surface acoustic wave filter device being 180° out of phase
with transmission phase characteristics of said first, second, and third surface
acoustic wave filter devices;
an unbalanced terminal for electrically connecting one terminal of a first group
obtained by cascade-connecting said first and second surface acoustic wave filter
devices in parallel to one terminal of a second group obtained by cascade-connecting
said third and fourth surface acoustic wave filter devices; and
balanced terminals for electrically connecting the other terminal of the first
group in series to the other terminal of the second group; wherein
the structure of the reflectors of at least one of said first through fourth
surface acoustic wave filter devices is different from the structure of the reflectors
of the other surface acoustic wave filter devices.
10. A surface acoustic wave filter apparatus according to claim 9, wherein the
structure of the reflectors of the first group is different from the structure
of the reflectors of the second group.
11. A surface acoustic wave filter apparatus according to claim 9, wherein the
structures of the reflectors are different among said first through fourth surface
acoustic wave filter devices in at least one of the number, the pitch, the duty,
and the thickness of electrode fingers of the reflectors.
12. A surface acoustic wave filter apparatus according to claim 9, wherein the
piezoelectric substrate is a LiTaO
3 piezoelectric substrate.
13. A communication apparatus comprising the surface acoustic wave filter apparatus
according to claim 9.
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a surface acoustic wave (SAW) filter apparatus,
and more particularly, to a SAW filter apparatus having a balanced-to-unbalanced
conversion function and having different impedance characteristics at an input
side and an output side of the SAW apparatus. The present invention also relates
to a communication apparatus including the above-described SAW filter apparatus.
2. Description of the Related Art
There has been significant technological progress in decreasing the size and
the weight of portable communication apparatuses, such as cellular telephones.
One way to achieve such results is to reduce the number and the size of the individual
components of the communication apparatus. Additionally, components having composite
functions are being developed.
In view of this background, research is being actively conducted with respect
to a SAW filter apparatus used in an RF stage provided with a balanced-to-unbalanced
conversion function (so-called "balun function"). Such SAW filter apparatuses are
being mainly used in a global system for mobile communications (GSM).
Generally, in a communication apparatus, an unbalanced signal having a
characteristic impedance of 50 Ω is used for a portion from an antenna to
a filter. For an amplifier, which is the subsequent stage of the filter, a balanced
signal having an impedance of 150 Ω to 200 Ω is usually used.
As a SAW filter apparatus provided with a balun function for converting a 50
Ω
unbalanced signal into a 150 Ω to 200 Ω balanced signal, a SAW filter
apparatus which implements an unbalanced input and a balanced output by using four
SAW filter devices is disclosed in, for example, Japanese Unexamined Patent Application
Publication No. 10-117123. The configuration of the SAW filter apparatus disclosed
in this publication is shown in FIG.
8.
The SAW filter apparatus shown in FIG. 8 includes two SAW filter units
511
and
512. The SAW filter unit
511 is constructed by cascade-connecting
SAW filter devices
501 and
502 having equal phase characteristics,
while the SAW filter unit
512 is constructed by cascade-connecting SAW filter
devices
503 and
504, having transmission phase characteristics that
are about 180° out of phase with each other. The input terminals of the SAW
filter units
511 and
512 are connected in parallel to each other
by an unbalanced terminal
505, while the output terminals of the SAW filter
units
511 and
512 are connected in series to each other by balanced
terminals
506 and
507.
In the SAW filter apparatus provided with the above-described balanced-to-unbalanced
input/output function, the outputs from the balanced terminals
506 and
507
are used as a difference between the balanced terminals
506 and
507.
Accordingly, the maximum output can be obtained when the electrical signals from
the balanced terminals
506 and
507 are 180° out of phase with
each other. Conversely, when the electrical signals from the balanced terminals
506 and
507 are in phase with each other, they cancel each other
out. Accordingly, a higher level of attenuation can be obtained as the two electrical
signals have closer levels.
Thus, the SAW filter apparatus is desirably configured so that the outputs
of the balanced terminals
506 and
507 are 180° out of phase
with each other in the pass band, and they are in phase with each other in the
stop band (other than the pass band).
In the SAW filter apparatus disclosed in Japanese Unexamined Patent Application
Publication No. 10-117123, four SAW filter devices are used, and for inverting
the phase of one of the SAW filter devices, the directions of the comb-like electrodes
(interdigital transducers: hereinafter simply referred to as "IDTs") are inverted
with respect to the SAW propagating direction as the symmetric axis, or the pitch
between the IDTs of one of the SAW filter devices
511 and
512 is
increased by 0.5 λ (wavelength).
With this configuration, the phase characteristics of the balanced terminals
506 and
507 are inverted in the pass band, while they are in phase
with each other in a frequency band in which a SAW is not excited.
In the above-configured SAW filter apparatus, however, spurious responses are
generated in a region in the vicinity of the pass band due to the excitation of
a SAW, and the phase characteristics of the balanced terminals
506 and
507
in the region in which spurious responses are generated are disadvantageously inverted
with respect to each other, as in the pass band. Thus, signals output from the
balanced terminals
506 and
507 do not cancel each other out, and
the attenuation in the frequency region other than the pass band is not sufficient.
SUMMARY OF THE INVENTION
In order to overcome the problems described above, preferred embodiments of the
present invention provide a SAW filter apparatus provided with a balanced-to-unbalanced
input/output function exhibiting high attenuation characteristics even in a region
near the pass band, and also provide a communication apparatus including such a
SAW filter apparatus.
According to a preferred embodiment of the present invention, a SAW filter
apparatus includes a SAW filter device disposed on a piezoelectric substrate. The
SAW filter device includes a plurality of IDTs arranged in a SAW propagating direction,
and reflectors arranged to reflect the SAW propagating from each of the plurality
of IDTs to the corresponding IDT. The SAW device is provided with a balanced-to-unbalanced
conversion function. The structure of at least one of the reflectors is different
from the structure of the other reflector.
With this configuration, by providing a plurality of IDTs arranged in the SAW
propagating direction, a filtering function, which is determined by the conversion
between the electrical signal of each IDT and the SAW, can be exhibited in which
the electrical signals in the pass band are allowed to pass with a low insertion
loss and the electrical signals outside the pass band are minimized. In addition
to the filtering function, the SAW filter device is provided with the balanced-to-unbalanced
conversion function. The reflectors for reflecting the SAWs propagating from the
IDTs to the IDTs are also provided for the SAW filter device, thereby improving
the conversion efficiency from the generated SAWs to the electrical signals.
Additionally, the structure of at least one of the reflectors is different
from that of the other reflector. Thus, the generation of unwanted spurious responses
in a region outside the pass band, and in particular, in a region near the pass
band, can be minimized, thereby obtaining a sufficient attenuation level.
According to another preferred embodiment of the present invention, a SAW
filter apparatus includes a first SAW filter device disposed on a piezoelectric
substrate and including a plurality of IDTs arranged in a SAW propagating direction,
and reflectors arranged such that they sandwich the plurality of IDTs therebetween.
A second SAW filter device is disposed on the piezoelectric substrate and includes
a plurality of IDTs arranged in a SAW propagating direction, and reflectors arranged
such that they sandwich the plurality of IDTs therebetween. The transmission phase
characteristics of the second SAW filter device are 180° out of phase with
the transmission phase characteristics of the first SAW filter device. An unbalanced
terminal is used for electrically connecting one terminal of the first SAW filter
device in parallel to one terminal of the second SAW filter device. Balanced terminals
are used for electrically connecting the other terminal of the first SAW filter
device to the other terminal of the second SAW filter device. The structure of
the reflectors of the first SAW filter device is different from that of the reflectors
of the second SAW filter device.
In the aforementioned SAW filter apparatus, the reflectors of the first SAW filter
device may be different from those of the second SAW filter device in at least
one of the number, the pitch, the duty, and the thickness of the electrode fingers
of the reflectors.
With this configuration, the structure of at least one of the reflectors is
different from that of the other reflectors. Thus, the generation of unwanted spurious
responses in a region outside the pass and, in particular, in a region near the
pass band, can be minimized, thereby easily obtaining a sufficient attenuation
level even with one stage of filter devices.
According to still another preferred embodiment of the present invention,
a SAW filter apparatus includes first, second, and third SAW filter devices disposed
on a piezoelectric substrate. Each of the first, second, and third SAW filter devices
includes a plurality of IDTs arranged in a SAW propagating direction, and reflectors
arranged such that they sandwich the plurality of IDTs therebetween. A fourth SAW
filter device is disposed on the piezoelectric substrate and includes a plurality
of IDTs in a SAW propagating direction, and reflectors arranged such that they
sandwich the plurality of IDTs therebetween. The transmission phase characteristics
of the fourth SAW filter device are 180° out of phase with those of the first,
second, and third SAW filter devices. An unbalanced terminal is used for electrically
connecting one terminal of a first group obtained by cascade-connecting the first
and second SAW filter devices in parallel to one terminal of a second group obtained
by cascade-connecting the third and fourth SAW filter devices. Balanced terminals
are used for electrically connecting the other terminal of the first group in series
to the other terminal of the second group. The structure of the reflectors of at
least one of the first through fourth SAW filter devices is different from that
of the reflectors of the other SAW filter devices.
With this configuration, by providing a plurality of stages of filter devices,
a balanced-to-unbalanced input/output function having different input/output impedances
can be achieved. By differentiating the structures of the reflectors, the generation
of unwanted spurious responses in a region outside the pass band, in particular,
in a region near the pass band, can be minimized, and the attenuation level can
be further improved over that obtained by a SAW filter apparatus having a first
stage of filter devices.
In the aforementioned SAW filter apparatus, the structure of the reflectors of
the first group may be different from that of the reflectors of the second group.
With this arrangement, the generation of unwanted spurious responses in a region
outside the pass band, in particular, in a region near the pass band, can be reliably minimized.
In the aforementioned SAW filter apparatus, the structures of the reflectors
may
be different among the first through fourth SAW filter devices in at least one
of the number, the pitch, the duty, and the thickness of electrode fingers of the reflectors.
According to a further preferred embodiment of the present invention, a
communication apparatus includes one of the above-described SAW filter apparatuses.
By using the SAW filter apparatus having a low insertion loss in the pass band
and a high attenuation level in a region outside the pass band, in particular,
in a region lower than the pass band, and exhibiting excellent transmission characteristics,
the communication apparatus exhibits excellent communication characteristics.
Other features, elements, characteristics and advantages of the present invention
will become more apparent from the following detailed description of preferred
embodiments with reference to the attached drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic diagram illustrating a SAW filter apparatus according
to a first preferred embodiment of the present invention;
FIG. 2 is a diagram illustrating the transmission characteristics with respect
to the frequency in the SAW filter apparatus shown in FIG. 1;
FIG. 3 is a diagram illustrating the transmission characteristics with respect
to the frequency in a known SAW filter apparatus;
FIG. 4 is a schematic diagram illustrating a SAW filter apparatus according
to a second preferred embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating a SAW filter apparatus according
to a third preferred embodiment of the present invention;
FIG. 6 is a schematic diagram illustrating a SAW filter apparatus according
to a fourth preferred embodiment of the present invention;
FIG. 7 is a block diagram schematically illustrating a communication apparatus
according to a fifth preferred embodiment of the present invention; and
FIG. 8 is a schematic diagram illustrating a known SAW filter apparatus.
DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
The present invention is described in detail below with reference to FIGS. 1
through 7 through illustration of preferred embodiments.
In a SAW filter apparatus constructed in accordance with a first preferred embodiment
of the present invention, as shown in FIG. 1, first through fourth SAW filter devices
101 through
104 are disposed on a piezoelectric substrate. The transmission
phase characteristics of the fourth SAW filter device
104 are substantially
180° out of phase with those of the third SAW filter device
103. The
piezoelectric substrate is not shown in FIG.
1.
The first SAW filter device
101 preferably has three IDTs
123,
121, and
122. The IDTs each have a strip-like base portion (bus bar)
and two electrode portions provided with a plurality of strip-like electrode fingers.
The electrode fingers extend substantially perpendicularly from one side of the
base portion such that they are substantially parallel to each other. The electrode
fingers also interdigitate with each other such that the sides thereof face each other.
In the above-configured IDTs, the signal conversion characteristics and the pass
band (in other words, the bands other than the pass band) can be determined by
setting the length and the width of each electrode finger, the pitch between adjacent
electrode fingers, and the length by which interdigitated electrode fingers face
each other (hereinafter referred to as the "interdigital length").
The IDTs
123,
121, and
122 are disposed on the piezoelectric
substrate so that the electrode fingers extend substantially perpendicularly to
the SAW propagating direction, and also the IDTs
123,
121, and
122
are arranged in this order in accordance with the SAW propagating direction. The
central IDT
121 includes a signal electrode finger
121a connected
to an unbalanced terminal
111 and a ground electrode finger
121b.
The IDT
122 includes a signal electrode finger
122a and a
ground electrode finger
122b. The IDT
123 includes a signal
electrode finger
123a and a ground electrode finger
123b.
In the first SAW filter device
101, reflectors
124 and
125
are arranged along the SAW propagating direction such that they sandwich the IDTs
123,
121, and
122 therebetween. The reflectors
124
and
125 have the function of reflecting a propagating SAW thereon and reflecting
back the SAW to the original position.
Accordingly, the reflector
124 is disposed in the SAW propagating
direction opposite to the IDT
121 across the IDT
122, while the reflector
125 is disposed in the SAW propagating direction opposite to the IDT
121
across the IDT
123.
Each of the reflectors
124 and
125 includes a pair of strip-like
base portions (bus bars) and a plurality of electrode fingers extending from one
side of each of the base portions on the piezoelectric substrate. The electrode
fingers extend substantially parallel with each other and extending in the direction
that is substantially perpendicular to the longitudinal direction of the base portions
so as to interconnect the two base portions.
With this configuration, the reflectors
124 and
125 are excited
by the propagating SAW, and a SAW generated by the excitation electrical signal
cancels the propagating SAW. The reflectors
124 and
125 also generate
a SAW in the opposite direction to the SAW propagating direction. That is, the
reflectors
124 and
125 reflect the propagating SAW in a pseudo manner.
The second SAW filter device
102 has substantially the same amplitude
characteristics and the phase characteristics as those of the first SAW filter
device
101.
The second SAW filter device
102 is arranged so that the SAW propagating
direction thereof is substantially parallel to that of the first SAW filter device
101, and such that the second SAW filter device
102 is symmetrical
to the first SAW filter device
101 with respect to the above-described SAW
propagating direction.
With this arrangement, the first SAW filter device
101 and the second
SAW filter device
102 can be positioned in close proximity with each other,
and the connection thereof can be simplified, thereby decreasing the size of the filters.
In the above-configured second SAW filter device
102, signal electrode
fingers
122a and
123a are connected to the signal electrode
fingers
122a and
123a, respectively, of the first SAW
filter device
101, and thus, the first and second SAW filters
101
and
102 can be cascade-connected. A signal electrode finger
121a
of the central IDT
121 of the second SAW filter device
102 is
connected to one balanced terminal
112.
The configuration of the third SAW filter device
103 is similar to that
of the first SAW filter device
101, except that reflectors
126 and
127 which are configured differently from the reflectors
124 and
125 are used (for example, the number of electrode fingers are different).
It is preferable that the third SAW filter device
103 is arranged along
the SAW propagation path of the first SAW filter device
101 and connected
in series to the SAW propagating direction of the first SAW filter device
101.
In the first SAW filer device
101, the reflectors
124 and
125
are disposed such that they sandwich the IDTs
122,
121, and
123
therebetween, and in the third SAW filter device
103, the reflectors
126
and
127 are disposed such that they sandwich the IDTs
122,
121,
and
123 therebetween. Accordingly, the interference of the SAWs between
the first and third SAW filter devices
101 and
103 can be prevented.
With this arrangement, the third SAW filter device
103 can be disposed
in series to the first SAW filter device
101, and the size of the resulting
SAW apparatus can be reduced compared to a SAW apparatus in which SAW filter devices
are disposed outside the SAW propagation path.
The configuration of the fourth SAW filter device
104 is similar to that
of the third SAW filter device
103, except that a central IDT
128
which is 180° out of phase with the central IDT
121 of the third SAW
filter device
103 is used.
Signal electrode fingers
122a and
123a of the
fourth SAW filter device
104 are respectively connected to the signal electrode
fingers
122a and
123a of the third SAW filter device
103. A signal electrode finger
128a of the IDT
128
of the fourth SAW filter device
104 is connected to the other balanced terminal
113.
The fourth SAW filter device
104 is disposed in close proximity with the
third SAW filter device
103 so that the SAW propagation directions become
substantially in parallel with each other. The SAW propagating direction of the
fourth SAW filter device
104 may be on the SAW propagation path of the second
SAW filter device
102. With this configuration, the size of the resulting
SAW filter apparatus can be further reduced.
Examples of the specific configurations of the first through fourth SAW
filter devices
101 through
104 are as follows:
The configuration of the first SAW filter device 101 is:
interdigital length W: about 125 μm;
number of pairs of electrode fingers of second IDT: 15;
number of pairs of electrode fingers of first IDT: 20;
number of pairs of electrode fingers of third IDT: 15;
IDT pitch PI: about 2.25 μm;
duty (electrode coverage) L/P: about 0.70;
number of electrode fingers of reflector NR: 90;
reflector pitch PR: about 2.30 μm; and
thickness of reflector: about 370 nm.
The configuration of the second SAW filter device 102 is:
interdigital length W: about 125 μm;
number of pairs of electrode fingers of second IDT: 15;
number of pairs of electrode fingers of first IDT: 20;
number of pairs of electrode fingers of third IDT: 15;
IDT pitch PI: about 2.25 μm;
duty (electrode coverage) L/P: about 0.70;
number of electrode fingers of reflector NR: 90;
reflector pitch PR: about 2.30 μm; and
thickness of reflector: about 370 nm.
The configuration of the third SAW filter device 103 is:
interdigital length W: about 125 μm;
number of pairs of electrode fingers of second IDT: 15;
number of pairs of electrode fingers of first IDT: 20;
number of pairs of electrode fingers of third IDT: 15;
IDT pitch PI: about 2.25 μm;
duty (electrode coverage) L/P: about 0.70;
number of electrode fingers of reflector NR: 73;
reflector pitch PR: about 2.30 μm; and
thickness of reflector: about 370 nm.
The configuration of the fourth SAW filter device 104 is:
interdigital length W: about 125 μm;
number of pairs of electrode fingers of second IDT: 15;
number of pairs of electrode fingers of first IDT: 20;
number of pairs of electrode fingers of third IDT: 15;
IDT pitch PI: about 2.25 μm;
duty (electrode coverage) L/P: about 0.70;
number of electrode fingers of reflector NR: 73;
reflector pitch PR: about 2.30 μm; and
thickness of reflector: about 370 nm.
The above-described first through fourth SAW filter devices
101 through
104 are disposed on, for example, a LiTaO
3 piezoelectric substrate.
However, the piezoelectric substrate is not restricted to the above type. In the
above-described specific configurations of the SAW filter devices, the first IDT
indicates the central IDT, for example, the IDT
121, and the second and
third IDTs are IDTs disposed across the central IDT, for example, the IDTs
122
and
123.
The central IDT
128 of the fourth SAW filter device
104 is inverted
relative to the central IDTs
121 of the first through third SAW filter devices
101 through
103. Accordingly, the transmission phase characteristics
of the fourth SAW filter device
104 are about 180° out of phase with
those of the first through third SAW filter devices
101 through
103.
A first SAW filter group including the first and second SAW filter devices
101
and
102 is different from a second SAW filter group including of the third
and fourth SAW filter devices
103 and
104 in the structures of the
reflectors. For example, the number of electrode fingers of the reflectors
124
and
125 are different from those of the reflectors
126 and
127.
Other characteristics of the reflectors
124 and
125 may be different
from those of the reflectors
126 and
127.
Only a few pairs of electrode fingers of each IDT and a few electrode fingers
of each reflector are shown in FIG. 1 since all of the electrode fingers cannot
be shown.
The characteristics of the SAW filter apparatus of the first preferred embodiment
are shown in FIG.
2. In the first preferred embodiment, the characteristics,
in particular, the attenuation at the range lower than the pass band, are improved
over that of a known SAW apparatus having the characteristics shown in FIG.
3.
In the first preferred embodiment, substantially equal transmission characteristics
within the stop bands of the reflectors
124 and
125 are obtained
among the first through third SAW filter devices
101 through
103.
In the fourth SAW filter device
104, transmission characteristics within
the stop bands of the reflectors
126 and
127 are obtained such that
phase characteristics are substantially 180° out of phase with those of the
first through third SAW filter devices
101 through
103 and that amplitude
characteristics are substantially the same as those of the first through third
SAW filter devices
101 through
103.
By connecting the above-described first through fourth SAW filter devices
101,
102,
103, and
104 as described in the first preferred embodiment,
signals having phase characteristics that are 180° out of phase with each
other are input into the output balanced terminals
112 and
113. It
is thus possible to provide a SAW filter apparatus having an unbalanced input terminal
(having an impedance of, for example, about 50 Ω) and balanced output terminals
(having an impedance of, for example, about 200 Ω).
In the fourth SAW filter device
104, by inverting the direction of the
IDT
128 which excites a SAW relative to that of the IDTs
121 of the
first through third SAW filter devices
101,
102, and
103 with
respect to the SAW propagating direction as the symmetric axis, the transmission
phase characteristics of the fourth SAW filter device
104 are changed. Thus,
in a region in which a SAW is not excited, the transmission characteristics of
the fourth SAW filter device
104 are substantially the same as those of
the first through third SAW filter devices
101 through
103. As a
result, in-phase electrical signals output from the balanced terminals
112
and
113 cancel each other out, thereby obtaining a high level of attenuation.
Even outside the stop bands of the reflectors, there is a frequency range near
the pass band in which a SAW is excited. The transmission characteristics of this
frequency range are determined by the number, the duty (electrode coverage), the
pitch, and the thickness of the electrode fingers of the reflectors. Accordingly,
if the structures of the reflectors are the same among the first through fourth
SAW filter devices
101 through
104, the signals obtained at the output
terminals are out of phase with each other, as in the pass band. Thus, a sufficient
level of attenuation cannot be obtained.
According to the first preferred embodiment, however, the number of electrode
fingers of the reflectors is differentiated between the reflectors
124 and
125 of the first and second SAW filter devices
101 and
102
and the reflectors
126 and
127 of the third and fourth SAW filter
devices
103 and
104. Thus, in the region other than the stop bands
of the reflectors, in particular, in the frequency range lower than the pass band,
the phase characteristics of the electrical signal are changed.
With this configuration, the electrical signals at the balanced terminals are
in phase with each other even in a frequency range near the pass band, thereby
achieving a sufficient level of attenuation by utilizing the cancellation effect
of the signals. Instead of differentiating the number of electrode fingers of the
reflectors between the SAW filter devices, the duty (electrode coverage), the pitch,
or the thickness of the reflectors can be changed between the SAW filter devices,
in which case, advantages similar to those of the first preferred embodiment can
be obtained.
As one way of improving the attenuation by differentiating the structure of the
reflectors, Japanese Unexamined Patent Application Publication No. 7-131291 discloses
cascade-connected SAW filter devices in which the pitch or the number of electrode
fingers of the reflectors is changed between the first and second stages of the filters.
In the above publication, the attenuation level is increased in view of the amplitude
characteristics by changing the spurious frequency between the first and second
stages. According to preferred embodiments of the present invention, however, by
utilizing the characteristics of a balanced filter in which electrical signals
having substantially equal amplitude characteristics and a phase difference of
180° at the balanced terminals cancel each other out, the attenuation level
is greatly improved. Thus, the principle of the present invention is totally different
from that of the above publication.
A SAW filter apparatus constructed in accordance with a second preferred embodiment
of the present invention is described below with reference to FIG.
4. In
the second preferred embodiment, elements having functions similar to those of
the first preferred embodiment are designated with like reference numerals, and
an explanation thereof is thus omitted.
The SAW filter apparatus of the second preferred embodiment includes first through
fourth SAW filter devices
201 through
204 disposed on a piezoelectric
substrate. In this SAW filter apparatus, a central IDT
228 of the second
SAW filter device
202 is inverted relative to central IDTs
221 of
the first, third, and fourth SAW filter devices
201,
203, and
204.
In FIG. 4, the piezoelectric substrate is not shown.
In the second preferred embodiment, the number of electrode fingers of the central
IDTs of the first through fourth SAW filter devices
201 through
204
is preferably an even number. With this configuration, as in the configuration
of the first preferred embodiment, the output terminals
112 and
113
function as balanced terminals. The structure of the reflectors
124 and
125 of the first and second SAW filter devices
201 and
202
is different from that of the reflectors
126 and
127 of the third
and fourth SAW filter devices
203 and
204. For example, the number
of electrode fingers of the reflectors is different between the first and second
SAW filter devices
201 and
202 and the third and fourth SAW filter
devices
203 and
204. With this configuration, the phase characteristics
in the frequency range other than the pass band can be changed between the first
and second SAW filters
201 and
202 and the third and fourth SAW filters
203 and
204. It is thus possible to obtain a sufficient level of
attenuation by utilizing the cancellation of electrical signals at the balanced
terminals
112 and
113.
A description is now given of a SAW filter apparatus constructed in accordance
with a third preferred embodiment of the present invention with reference to FIG.
5. The SAW filter apparatus of the third preferred embodiment includes first
and second SAW filter devices
301 and
302 on a piezoelectric substrate.
The transmission phase characteristics of the second SAW filter device
302
are substantially 180° out of phase with those of the first SAW filter device
301. This is because a central IDT
328 of the second SAW filter device
302 is inverted relative to the central IDT
121 of the first SAW
filter device
301.
The piezoelectric substrate is not shown in FIG.
5. The components having
functions similar to those of the first preferred embodiment are indicated by like
reference numerals, and an explanation thereof is thus omitted.
The configuration of the first SAW filter device 301 is:
interdigital length W: about 115 μm;
number of pairs of electrode fingers of second IDT: 12;
number of pairs of electrode fingers of first IDT: 17;
number of pairs of electrode fingers of third IDT: 12;
IDT pitch PI: about 2.10 μm;
duty (electrode coverage) L/P: about 0.72;
number of electrode fingers of reflector NR: 90;
reflector pitch PR: about 2.15 μm; and
thickness of reflector: about 345 nm.
The configuration of the second SAW filter device 302 is:
interdigital length W: about 115 μm;
number of pairs of electrode fingers of second IDT: 12;
number of pairs of electrode fingers of first IDT: 17;
number of pairs of electrode fingers of third IDT: 12;
IDT pitch PI: about 2.10 μm;
duty (electrode coverage) L/P: about 0.70;
number of electrode fingers of reflector NR: 73;
reflector pitch PR: about 2.15 μm; and
thickness of reflector: about 345 nm.
A LiTaO
3 substrate is preferably used as the piezoelectric substrate.
According to the third preferred embodiment, the transmission characteristics
having a phase difference of 180° and substantially equal amplitude characteristics
in the stop bands of the reflectors between the first and second SAW filter devices
301 and
302 are obtained.
By connecting the first and second SAW filter devices
301 and
302
as in the third preferred embodiment, it is possible to obtain a SAW filter apparatus
in which the input terminal function as an unbalanced terminal, and the output
terminals function as balanced terminals.
There is a frequency range near the pass band and outside the stop bands of
the reflectors in which a SAW is excited. The transmission characteristics of this
frequency range are determined by the number, the duty (electrode coverage), the
pitch, and thickness of electrode fingers of the reflectors.
Accordingly, if the structures of the reflectors are equal between the
first and second SAW filter devices
301 and
302, the phase characteristics
of the electrical signals at the balanced terminals are inverted, as in the pass
band, thereby failing to obtain a sufficient level of attenuation.
In the third preferred embodiment, by differentiating the number of electrode
fingers of the reflector between the first and second SAW filter devices
301
and
302, the phase characteristics of the electrical signal in a frequency
range other than the stop bands, in particular, in a range lower than the pass
band, are changed. Thus, the electrical signals at the balanced terminals cancel
each other out, thereby achieving a sufficient level of attenuation even in the
region in the vicinity of the pass band.
A SAW filter apparatus constructed in accordance with a fourth preferred embodiment
of the present invention is discussed below with reference to FIG.
6. In
the fourth preferred embodiment, first and second SAW filter devices
401
and
402 are similar to the first and second SAW filter devices
301
and
302 of the third preferred embodiment. In the fourth preferred embodiment,
a SAW resonator
403 is connected to each of the input terminals and the
output terminals of the first and second SAW filter devices
401 and
402.
The configuration of the SAW resonators
403 is:
interdigital length W: about 80 μm;
number of pairs of electrode fingers of IDT: 90;
IDT pitch PI: about 2.10 μm;
duty (electrode coverage) L/P: about 0.65;
number of electrode fingers of reflector NR: 30; and
reflector pitch PR: about 2.10 μm.
A LiTaO
3 substrate is preferably used as the piezoelectric substrate.
In the SAW filter apparatus of the fourth preferred embodiment, by connecting
the SAW resonators
430 to the first and second SAW filter devices
401
and
402 (
301 and
302) as shown in FIG. 6, the attenuation
in a region other than the pass band can be improved.
In the fourth preferred embodiment, the SAW filter apparatus is obtained by adding
the SAW resonators
403 to the third preferred embodiment. As in the third
preferred embodiment, the phase characteristics of the electrical signal in a region
other than the stop bands, in particular, in a range lower than the pass band,
are changed, and the cancellation effect of the electrical signals at the balanced
terminals is greatly improved, thereby obtaining a high level of attenuation.
Additionally, in the fourth preferred embodiment, the SAW resonators
403 have a resonance point in the pass band, and have an antiresonance point
in the region other than the pass band, thereby effectively improving the attenuation
in a specific frequency range without increasing the in-band loss.
Although in the foregoing preferred embodiments a plurality of SAW filter
devices are used, only a single SAW filter device, for example, the fourth SAW
filter device
104 may be used. In this case, as in the foregoing preferred
embodiment, a balanced-to-unbalanced conversion function is provided, and the structures
of the reflectors are differentiated as discussed above. Then, the spurious level
can be minimized.
Additionally, for inverting the phase of at least one of the SAW filter
devices to the phases of the other SAW filter devices, the direction of one central
IDT is inverted. However, the pitch between certain IDTs may be changed from the
pitches of the other IDTs by about 0.5 λ (wavelength) so that the corresponding
SAW filter device may be set 180° out of phase with respect to the other SAW
filter devices.
In the aforementioned preferred embodiments, the input terminal is preferably
used as the unbalanced terminal, and the output terminals are used as the balanced
terminals. However, the input terminals may function as the balanced terminals,
and the output terminal may function as the unbalanced terminal.
A description is now given, with reference to FIG. 7, a communication apparatus
including at least one of the SAW filter apparatus of one of the first through
fourth preferred embodiments according to a fifth preferred embodiment of the present invention.
In a communication apparatus
600, as shown in FIG. 7, a receiver (Rx)
includes
an antenna
601, an antenna duplexer/RF top filter
602, an amplifier
603, an Rx section filter
604, a mixer
605, a first IF filter
606, a mixer
607, a second IF filter
608, a first-and-second-signal
local synthesizer
611, a temperature compensated crystal oscillator (TCXO)
612, a divider
613, and a local filter
614.
As indicated by two lines between the Rx section filter
604 and the mixer
605 shown in FIG. 7, two balanced signals are preferably transmitted from
the Rx section filter
604 to the mixer
605 in order to maintain the
balance characteristics.
In the communication apparatus
600, a transmitter (Tx) includes the antenna
601, the antenna duplexer/RF top filter
602, a Tx IF filter
621,
a mixer
622, a Tx section filter
623, an amplifier
624, a
coupler
625, an isolator
626, and an automatic power control (APC)
device
627. The antenna
601 and the antenna duplexer/RF top filter
602 are shared by the receiver (Rx) and the transmitter (Tx).
The SAW filter apparatus of one of the first through fourth preferred embodiments
is suitably used as the Rx section filter
604, the first IF filter
606,
the Tx IF filter
621, and the Tx section filter
623.
The SAW filter apparatus of preferred embodiments of the present invention is
provided with not only a filtering function, but also a balanced-to-unbalanced
conversion function, and also exhibits a high level of attenuation in a region
other than the pass band, in particular, in a range lower than the pass band. Thus,
according to the communication apparatus including the above-described SAW filter
apparatus having a composite function, the number of components of the communication
apparatus can be reduced, and accordingly, the size of the overall communication
apparatus can be decreased. The transmission characteristics (communication characteristics)
can also be greatly improved.
While preferred embodiments of the invention have been described above, it
is to be understood that variations and modifications will be apparent to those
skilled in the art without departing the scope and spirit of the invention. The
scope of the invention, therefore, is to be determined solely by the following claims.
*