Ultra-thin, high quality strained silicon-on-insulator formed by elastic strain transfer Number:6,991,998 from the United States Patent and Trademark Office (PTO) owispatent

Title: Ultra-thin, high quality strained silicon-on-insulator formed by elastic strain transfer

Abstract: A method of forming a semiconductor structure comprising a first strained semiconductor layer over an insulating layer is provided in which the first strained semiconductor layer is relatively thin (less than about 500 Å) and has a low defect density (stacking faults and threading defects). The method of the present invention begins with forming a stress-providing layer, such a SiGe alloy layer over a structure comprising a first semiconductor layer that is located atop an insulating layer. The stress-providing layer and the first semiconductor layer are then patterned into at least one island and thereafter the structure containing the at least one island is heated to a temperature that causes strain transfer from the stress-providing layer to the first semiconductor layer. After strain transfer, the stress-providing layer is removed from the structure to form a first strained semiconductor island layer directly atop said insulating layer.

Patent Number: 6,991,998 Issued on 01/31/2006 to Bedell,   et al.

---

Inventors:	Bedell; Stephen W. (Wappingers Falls, NY); Domenicucci; Anthony G. (New Paltz, NY); Fogel; Keith E. (Mohegan Lake, NY); Leobandung; Effendi (Wappingers Falls, NY); Sadana; Devendra K. (Pleasantville, NY)
Assignee:	International Business Machines Corporation (Armonk, NY)
Appl. No.:	883883
Filed:	July 2, 2004

Current U.S. Class:	438/479; 438/164; 438/795
Current Intern'l Class:	H01L 21/20    (20060101)
Field of Search:	438/478,479,480,795,164

---

References Cited [Referenced By]

---

U.S. Patent Documents

3602841	Aug., 1971	McGroddy.
4665415	May., 1987	Esaki et al.
4853076	Aug., 1989	Tsaur et al.
4855245	Aug., 1989	Neppl et al.
4952524	Aug., 1990	Lee et al.
4958213	Sep., 1990	Eklund et al.
5006913	Apr., 1991	Sugahara et al.
5060030	Oct., 1991	Hoke.
5081513	Jan., 1992	Jackson et al.
5108843	Apr., 1992	Ohtaka et al.
5134085	Jul., 1992	Gilgen et al.
5310446	May., 1994	Konishi et al.
5354695	Oct., 1994	Leedy.
5371399	Dec., 1994	Burroughes et al.
5391510	Feb., 1995	Hsu et al.
5459346	Oct., 1995	Asakawa et al.
5471948	Dec., 1995	Burroughes et al.
5557122	Sep., 1996	Shrivastava et al.
5561302	Oct., 1996	Candelaria.
5565697	Oct., 1996	Asakawa et al.
5571741	Nov., 1996	Leedy et al.
5592007	Jan., 1997	Leedy.
5592018	Jan., 1997	Leedy.
5670798	Sep., 1997	Schetzina.
5679965	Oct., 1997	Schetzina.
5683934	Nov., 1997	Candelaria.
5840593	Nov., 1998	Leedy.
5861651	Jan., 1999	Brasen et al.
5880040	Mar., 1999	Sun et al.
5940736	Aug., 1999	Brady et al.
5946559	Aug., 1999	Leedy.
5960297	Sep., 1999	Saki.
5989978	Nov., 1999	Peidous.
6008126	Dec., 1999	Leedy.
6025280	Feb., 2000	Brady et al.
6046464	Apr., 2000	Schetzina.
6066545	May., 2000	Doshi et al.
6090684	Jul., 2000	Ishitsuka et al.
6107143	Aug., 2000	Park et al.
6117722	Sep., 2000	Wuu et al.
6133071	Oct., 2000	Nagai.
6165383	Dec., 2000	Chou.
6221735	Apr., 2001	Manley et al.
6228694	May., 2001	Doyle et al.
6246095	Jun., 2001	Brady et al.
6255169	Jul., 2001	Li et al.
6261964	Jul., 2001	Wu et al.
6265317	Jul., 2001	Chiu et al.
6274444	Aug., 2001	Wang.
6281532	Aug., 2001	Doyle et al.
6284623	Sep., 2001	Zhang et al.
6284626	Sep., 2001	Kim.
6319794	Nov., 2001	Akatsu et al.
6361885	Mar., 2002	Chou.
6362082	Mar., 2002	Doyle et al.
6368931	Apr., 2002	Kuhn et al.
6403486	Jun., 2002	Lou.
6403975	Jun., 2002	Brunner et al.
6406973	Jun., 2002	Lee.
6461936	Oct., 2002	Von Ehrenwall.
6476462	Nov., 2002	Shimizu et al.
6493497	Dec., 2002	Ramdani et al.
6498358	Dec., 2002	Lach et al.
6501121	Dec., 2002	Yu et al.
6506652	Jan., 2003	Jan et al.
6509618	Jan., 2003	Jan et al.
6521964	Feb., 2003	Jan et al.
6531369	Mar., 2003	Ozkan et al.
6531740	Mar., 2003	Bosco et al.
6699764	Mar., 2004	Tweet et al.
6855649	Feb., 2005	Christiansen et al.
2001/0009784	Jul., 2001	Ma et al.
2002/0074598	Jun., 2002	Doyle et al.
2002/0086472	Jul., 2002	Roberds et al.
2002/0086497	Jul., 2002	Kwok.
2002/0090791	Jul., 2002	Doyle et al.
2003/0032261	Feb., 2003	Yeh et al.
2003/0040158	Feb., 2003	Saitoh.
2003/0057184	Mar., 2003	Yu et al.
2003/0067035	Apr., 2003	Tews et al.
2004/0087119	May., 2004	Maa et al.
2004/0142541	Jul., 2004	Cohen et al.
2005/0098829	May., 2005	Doris et al.
Foreign Patent Documents
01/62362	Jun., 1989	EP.
0 967 636	Dec., 1999	EP.
1 174 928	Jan., 2002	EP.
WO 94/2731/7	May., 1993	WO.
WO 02/454156	Jun., 2002	WO.

Other References

Rim, et al., "Transconductance Enhancement in Deep Submicron Strained-Si n-MOSFETs", International Electron Devices Meeting, 26, 8, 1, IEEE, Sep. 1998. Rim, et al. "Characteristics and Device Design of Sub-100 nm Strained Si N- and PMOSFETs", 2002 Symposium On VLSI Technology Digest of Technical Papers, IEEE, pp 98-99. Scott, et al. "NMOS Drive Current Reduction Caused by Transistor Layout and Trench Isolation Induced Stress", International Electron Devices Meeting, 34.4.1, IEEE, Sep. 1999. Ootsuka, et al. "A Highly Dense, High-Performance 130nm node CMOS Technology for Large Scale System-on-a-Chip Application", International Electron Device Meeting, 23.5.1, IEEE, Apr. 2000. Ito, et al. "Mechanical Stress Effect of Etch-Stop Nitride and its Impact on Deep Submicron Transistor Design", International Electron Devices Meeting, 10.7.1, IEEE, Apr. 2000. Shimizu, et al. "Local Mechanical-Stress Control (LMC) : A New Technique for CMOS-Performance Enhancement", International Electron Devices Meeting, IEEE, Mar. 2001. Ota, et al. "Novel Locally Strained Channel Technique for high Performance 55nm CMOS", International Electron Devices Meeting, 2.2.1, IEEE, Feb. 2002. Ouyang, et al. "Two-Dimensional Bandgap Engineering in a Novel Si/SiGe pMOSFETS With Enhanced Device Performance and Scalability", Microelectronics Research Center, pp 151-154, 2000 IEEE. Sayama et al., "Effect of <Channel Direction for High Performance SCE Immune pMOSFET with Less Than 0.15um Gate Length"ULSI Development Center, pp27.5.1-27.5.4, 1999 IEEE.

Primary Examiner: Quach; T. N.
Attorney, Agent or Firm: Scully, Scott, Murphy & Presser, Trepp; Robert M.

---

Claims

---

What we claim as new is:

1. A method of forming a first strained semiconductor layer over an insulating layer comprising the steps of:

forming a stress-providing layer over a structure comprising a first semiconductor layer, said first semiconductor layer is located atop an insulating layer;

patterning said stress-providing layer and said first semiconductor layer into at least one island;

heating the structure containing said at least one island to a temperature that causes strain transfer from the stress-providing layer to the first semiconductor layer; and

removing the stress-providing layer to form a first strained semiconductor island layer directly atop said insulating layer.

2. The method of claim 1 wherein said first semiconductor layer and said insulating layer are components of a preformed silicon-on-insulator substrate.

3. The method of claim 2 wherein said preformed silicon-on-insulator substrate is fabricated by separation by ion implantation of oxygen or a layer transfer process.

4. The method of claim 1 wherein at least one implantation step is performed between said forming and patterning step.

5. The method of claim 4 wherein said at least one implantation step comprises implanting a dopant species into at least said insulating layer.

6. The method of claim 5 wherein said dopant species is boron.

7. The method of claim 4 wherein said at least one implantation step comprises implanting an energetic ion at, or near, an interface formed between the first semiconductor layer and the insulating layer.

8. The method of claim 7 wherein said energetic ion comprises hydrogen, deuterium, helium, oxygen, neon or mixtures and isotopes thereof.

9. The method of claim 7 wherein said energetic ion is a hydrogen ion.

10. The method of claim 1 wherein said patterning comprises lithography and etching.

11. The method of claim 1 wherein said first semiconductor layer comprises Si, SiC, SiGe, SiGeC, Ge, GaAs, InAs or InP.

12. The method of claim 1 wherein said stress-providing layer comprises a Ge-containing layer, a silicon nitride layer, a silicon carbide layer, a silicate glass or mixtures thereof.

13. The method of claim 1 wherein said heating step is performed at a temperature that causes the insulating layer to have a visco-elastic property.

14. The method of claim 13 wherein said heating is performed at a temperature that is about 900° C. or greater.

15. The method of claim 1 wherein said first strained semiconductor layer has a tensile strain.

16. The method of claim 1 wherein said first strained semiconductor layer has a compressive strain.

17. The method of claim 1 further comprising forming a second island having a second stress-providing layer that has a different stress then the stress in said stress-providing layer.

18. The method of claim 1 wherein said first semiconductor layer comprises III/V or II/VI compound semiconductor, where II, III, V and VI represents groups from the Periodic Table of Elements.

---

Description

---

RELATED APPLICATIONS

This application is related to co-pending and co-assigned U.S. patent application Ser. No. 10/300,189, filed Nov. 20, 2002, entitled "Relaxed Low-Defect SGOI For Strained Si CMOS Applications". The entire content of the aforementioned U.S. Patent Application is incorporated herein by reference.

FIELD OF THE INVENTION

The present invention relates to a method of fabricating a semiconductor structure that can be used as a substrate for high performance complementary metal oxide semiconductor (CMOS) devices, and more particularly to a method of creating a first strained semiconductor layer over an insulating layer. Even more particularly, the present invention provides a method of forming a strained semiconductor-on-insulator (SSOI) substrate material.

BACKGROUND OF THE INVENTION

In the semiconductor industry, there has recently been a high-level of activity using strained Si-based heterostructures to achieve high carrier mobility structures for complementary metal oxide semiconductor (CMOS) applications. Traditionally, to boost performance of NFET and PFET devices, the prior art to implement this has been to grow strain Si layers on a thick (on the order of about 1 to about 5 micrometers) relaxed SiGe buffer layers.

Despite the high channel electron mobilites reported for prior art heterostructures, the use of thick SiGe buffer layers has several noticeable disadvantages. First, thick SiGe buffer layers are not typically easy to integrate with existing Si-based CMOS technology. Second, the defect densities, including threading dislocations (TDs) and misfit dislocations (MDs) are from about 10⁶ to about 10⁸ defects/cm² which are still too high for realistic VLSI (very large scale integration) applications. Thirdly, the nature of the prior art structures precludes selective growth of the SiGe buffer layer so that circuits employing devices with strained Si, unstrained Si and SiGe materials are difficult, and in some instances, nearly impossible to integrate.

In view of the drawbacks mentioned above with prior art methods of manufacturing strained-Si based heterostructures in which a relaxed SiGe alloy layer remains in the structure, there is a need for developing a new and improved method that allows one to fabricate a strained Si-based heterostructure, while maintaining the standard CMOS processing procedures for standard (i.e., unstrained) Si technologies. Specifically, a new method is needed that allows for the fabrication of a strained semiconductor-on insulator-substrate (SSOI) in which the strained semiconductor layer is located directly atop an insulating layer.

SUMMARY OF THE INVENTION

The present invention provides a method for fabricating a thin (less than 500 Å) first semiconductor layer that is mechanically strained in a tensile or compressive manner over an insulating layer, which, in turn, exists on a semiconductor substrate. Specifically, the method of the present invention allows for the formation of a strained semiconductor-on-insulator (SSOI) heterostructure, without the presence of SiGe in the final structure.

The method of the present invention takes advantage of the visco-elastic properties of a buried insulating layer of a semiconductor substrate, which includes at least a first semiconductor layer located atop the buried insulating layer, when it is heated to high temperatures. Initially, a stress-providing layer, such as a strained SiGe alloy layer, a strained SiN layer, a strained SiC layer or any other layer that can be formed under either compressive or tensile strain, is formed on a surface of the first semiconductor layer of the substrate. The stress-providing layer can be under tensile or compressive stress at this point of the inventive process. The stress-providing layer and the first semiconductor layer are then patterned into islands using standard lithographic and etching techniques. A high-temperature annealing step is then performed to allow elastic relaxation of the stress-providing layer by expansion of the underlying first semiconductor layer on the now viscous buried insulating layer. At, or about, equilibrium, the in-plane forces arising from the stress (compressive or tensile) in the stress-providing layer are balanced by the stress (compressive or tensile), which has been transferred to the underlying first semiconductor layer as it expands on the buried insulating layer.

The annealing step of the present invention is performed in such a way as to minimize the amount of Ge diffusion into the first semiconductor layer. After the annealing step, the stress-providing layer is selectively removed at a temperature below the reflow temperature of the buried insulating layer. The reflow temperature of the buried insulating layer can be controlled in the present invention to some extent by doping it with different elements. For example, boron can be used as a dopant species to reduce the reflow temperature of the buried insulating layer. After removing the stress-providing layer, what remains is a thin, strained (tensile or compressive) first semiconductor layer (less than 500 Å) atop the buried insulating layer of the substrate.

In broad terms, the method of the present invention, which may also be referred to as Visco-Elastic Strain Transfer (VEST), includes the steps of:

• forming a stress-providing layer over a structure comprising a first semiconductor layer, said first semiconductor layer is located atop an insulating layer;
• patterning said stress-providing layer and said first semiconductor layer into at least one island;
• heating the structure containing said at least one island to a temperature that causes strain transfer from the stress-providing layer to the first semiconductor layer; and
• removing the stress-providing layer to form a first strained semiconductor island layer directly atop said insulating layer.

In some embodiments of the present invention, the VEST method described above can be modified so as to form a strained semiconductor-on-insulator (SSOI) that has selective strain values (positive and negative) by providing islands that have different stress-providing layers, e.g., SiGe/Si or SiN/Si.

In addition to the VEST method described above, the present invention also provides a strained semiconductor-on-insulator (SSOI) heterostructure in which at least one thin (less than 500 Å) strained first semiconductor island layer is located atop a buried insulating layer, where the strained first semiconductor island layer has a low stacking fault (SF) defect density (less than about 1000 SF defects/cm²) and a low threading defect density (on the order of less than about 10⁶ TDs/cm²).

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A-1D are pictorial representations (through cross sectional views) illustrating the basic processing steps that are employed in the present invention in fabricating a first strained semiconductor layer on top of an insulating layer.

FIG. 2 is a pictorial representation (through a cross sectional view) illustrating a strained semiconductor-on-insulator (SSOI) with selective strain values (positive or negative) that is formed using an alternative embodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

The present invention, which provides a method of fabricating a strained semiconductor-on-insulator (SSOI) heterostructure as well as a low-defect density (SFs and TDs) SSOI heterostructure produced by the inventive method, will now be described in greater detail by referring to the drawings that accompany the present application. The accompanying drawings, which are not drawn to scale, are provided for illustrative purposes only and like and/or corresponding elements referred to in the drawings are described with respect to like reference numerals.

The VEST process begins with first providing a layered structure 10 such as shown in FIG. 1A. Layered structure 10 includes a semiconductor substrate 12 having a stress-providing layer 20 located on an upper surface thereof. The semiconductor substrate 12 includes a bottom semiconductor layer 14, a buried insulating layer 16 and a top semiconductor layer 18 (hereinafter referred to as the first semiconductor layer).

In the embodiment depicted in FIG. 1A, the buried insulating layer 16 is present continuously throughout the entire structure. In another embodiment, which is not shown herein, the buried insulating layer 16 is present as discrete and isolated regions or islands that are surrounded by semiconductor material, i.e., layers 14 and 18.

The first semiconductor layer 18 comprises any semiconductor material which can have a strain imparted thereon. Examples of such semiconductor materials for the first semiconductor layer 18 include, but are not limited to: Si, SiC, SiGe, SiGeC, Ge, GaAs, InAs, InP or other III/V or II/V compound semiconductors. Preferably, the first semiconductor layer 18 is a Si-containing semiconductor material such as Si, SiC, SiGe, or SiGeC. Even more preferably, the first semiconductor layer 18 of semiconductor substrate 12 is comprised of Si or SiGe. The first semiconductor layer 18 is a single crystal material that typically has a misfit and TD density of less than about 1×10⁵ defects/cm².

The buried insulating layer 16 of the layered structure 10 shown in FIG. 1A comprises any material that is highly resistant to Ge diffusion. Examples of such insulating and Ge diffusion resistant materials include, but are not limited to: crystalline or non-crystalline oxides or nitrides. In one preferred embodiment, the buried insulating layer 16 is an oxide such as SiO₂.

The bottom semiconductor layer 14 of the substrate 12 includes any semiconductor material which can be the same or different than the semiconductor material of the first semiconductor layer 18.

The semiconductor substrate 12 may be a conventional silicon-on-insulator (SOI) substrate material wherein region 16 is a buried oxide (BOX) that electrically isolates a first semiconductor layer 18 from the bottom semiconductor 12. The SOI substrate may be formed utilizing conventional SIMOX (separation by ion implantation of oxygen) processes well-known to those skilled in the art, as well as the various SIMOX processes mentioned in co-assigned U.S. patent application Ser. No. 09/861,593, filed May 21, 2001; Ser. No. 09/861,594, filed May 21, 2001, now U.S. Pat. No. 6,486,037; Ser. No. 09/861,590, filed May 21, 2001, now U.S. Pat. No. 6,602,757; Ser. No. 09/861,596, filed May 21, 200, now U.S. Pat. Nos. 6,541,356; and Ser. No. 09/884,670, filed Jun. 19, 2001 as well as U.S. Pat. No. 5,930,634 to Sadana, et al., the entire contents of each are incorporated herein by reference. Note that the process disclosed in the '590 application can be employed herein to fabricate a patterned substrate.

Alternatively, the semiconductor substrate 12 may be made using other conventional processes including, for example, a layer transfer process in which thermal bonding and cutting are employed. In addition to these methods that form SOI substrates, the semiconductor substrate 12 may be a non-SOI substrate, which is made using conventional deposition processes as well as lithography and etching (employed when fabricating a patterned substrate). Specifically, when non-SOI substrates are employed, the initial structure is formed by depositing an insulating layer atop a surface of a semiconductor substrate, via conventional deposition or thermal growing processes, optionally patterning the insulating layer by employing conventional lithography and etching, and thereafter forming a first semiconductor layer atop the insulating layer using conventional deposition processes including, for example, chemical vapor deposition (CVD), plasma-assisted CVD, sputtering, evaporation, chemical solution deposition or epitaxial growth.

The thickness of the various layers of the semiconductor substrate 12 may vary depending on the process used in making the same. Typically, however, the first semiconductor layer 18 has a thickness that is less than about 500 Å, with a thickness from about 50 to about 450 Å being more typical. In the case of buried insulating layer 16, that layer may have a thickness from about 200 to about 20000 Å, with a thickness from about 500 to about 5000 Å being more typical. The thickness of the bottom semiconductor layer 14 is inconsequential to the present invention. It is noted that the thicknesses provided above are exemplary and by no ways limit the scope of the present invention.

A stress-providing layer 20 is then formed atop the upper surface layer, i.e., atop the first semiconductor layer 18, of the semiconductor substrate 12. The stress-providing layer 20 includes any material that is capable of inducing a stress to the underlying first semiconductor layer 18. The strain may be a compressive stress or a tensile stress depending on the type of material being deposited as well as the type of material present in the first semiconductor layer 18. Examples of stress-providing materials that can be employed as layer 20 include, but are not limited to: Ge-containing materials, such as pure Ge or a SiGe alloy layer that contain up to 99.99 atomic percent Ge, SiN, SiC, and silicate glasses such as boron phosphorous doped silicate (BPSG). In some preferred embodiments, the stress-providing layer 20 is comprised of a Ge-containing material, particularly a SiGe alloy, while in others the stress-providing layer 20 is comprised of SiN.

The stress-providing layer 20 can be formed by an epitaxial growth process including, for example, low-pressure chemical vapor deposition (LPCVD), ultra-high vacuum chemical vapor deposition (UHVCVD), atmospheric pressure chemical vapor deposition (APCVD), molecular beam epitaxy (MBE) and plasma-enhanced chemical vapor deposition (PECVD).

The thickness of the stress-providing layer 20 can vary depending upon the type of material and method used in forming the same. Typically, the stress-providing layer 20 has a thickness that is greater than the underlying first semiconductor layer 18. An illustrative thickness range for the stress-providing layer 20 is from about 200 to about 20000 Å, with a range from about 300 to about 5000 Å being more typical.

After providing the layered structure 10 shown in FIG. 1A, the structure shown in FIG. 1A may then be subjected to an optional ion implantation step wherein dopants that are capable of controlling the reflow temperature of the buried insulating layer 16 are implanted. The implant may be performed with, or without, the use of an implantation mask.

The types of dopant species that can be implanted at this point of the present invention include B, Al, P, Sb, As, Cs, Na, and/or F. The dopant species are implanted using conditions such that the peak dopant concentration is located substantially within the buried insulating layer 16.

The implant step of the present invention is conducted at approximately room temperature, i.e., a temperature from about 283 K to about 303 K, using a beam current density from about 0.01 to about 1 microamps/Cm². The concentration of the dopant species may vary depending upon the type of species employed. Typically, however, the concentration of dopant species being implanted at this point of the present invention is below 10¹⁷ cm^-2, with an ion concentration from about 10¹⁴ to about 10¹⁶ cm^-2 being more highly preferred. The energy of this implant may also vary depending upon the type of dopant species that is being implanted, with the proviso that the implant energy must be capable of positioning ions substantially within the buried insulating layer 16. For example, when boron is employed as the implant species, the energy used to ensure that the boron is substantially implanted into the buried insulating layer 16 is from about 10 to about 200 keV, with an energy from about 20 to about 150 keV being more highly preferred.

In another embodiment, energetic ions are optionally implanted into the layered structure 10 shown in FIG. 1A so that the energetic ions are implanted into, or near, the interface formed between the first semiconductor layer 18 and the buried insulating layer 16. The implant of energetic ions may be performed alone or in conjunction with the dopant species implant. It may occur before or after the implant of the dopant species. This implant of energetic ions serves to minimize diffusion of Ge from the stress-providing layer 20 when the same is comprised of a Ge-containing layer by lowering the thermal budget necessary to transfer strain from layer 20 to layer 18. Hydrogen, deuterium, helium, oxygen, neon, and mixtures thereof can be used to lower the thermal budget necessary to transfer strain from layer 20 to layer 18. It is believed that damage at the buried insulating layer 16/first semiconductor layer 18 interface facilitates lateral expansion of the island thereby lowering the temperature and/or time required for strain transfer. Isotopes of the aforementioned energetic ions are also contemplated herein. Preferred ions used in the present invention for this implant are hydrogen ions (H⁺). It is noted that other species of hydrogen such as H₂⁺ can also contemplated herein.

This optional implant step of the present invention at, or near the interface formed between the first semiconductor layer 18 and the buried insulating layer 16 is conducted at approximately room temperature, i.e., a temperature from about 283 K to about 303 K, using a beam current density from about 0.01 to about 1 microamp/cm². The concentration of the energetic ions being implanted may vary depending upon the type of implant species employed. Typically, however, the concentration of the energetic ions used at this point of the present invention is below 3E16 cm^-2, with an ion concentration from about 1E16 to about 2.99E16 cm^-2 being more highly preferred. The energy of this implant may also vary depending upon the type of ion that is being implanted, with the proviso that the implant energy must be capable of positioning ions at, or near, the first semiconductor/buried insulating layer interface. For example, when hydrogen is employed as the implant ion, the energy used is from about 1 to about 100 keV, with an energy from about 3 to about 20 keV being more highly preferred.

It is noted one of the implant steps mentioned above may be used, both implant steps (in any order) may be used or none of the implant steps may be used.

Next, the layered structure 10, particularly the stress-providing layer 20 and the first semiconductor layer 18, are patterned so as to form at least one island 22 comprising a stress-providing/first semiconductor bilayer on the surface of the buried insulating layer 16. The resultant structure including the at least one island 22 is shown, for example, in FIG. 1B.

The patterning is achieved using conventional lithography and etching. The lithography step includes forming a photoresist (not shown) on the surface of the stress-providing layer 20, subjecting the photoresist to a pattern of radiation and developing the photoresist using a conventional resist developer. The etching step includes any conventional etching process including, for example, a dry etching process such as reactive-ion etching, ion beam etching, plasma etching or laser ablation; a wet etch process in which a chemical etchant is employed; or any combination thereof. A single etch may be used or multiple etching steps can be used. The patterned resist can be removed prior to pattern transfer into the at least the stress-providing layer 20, or the patterned resist is removed after etching has been completed. Removal of the patterned resist is achieved by a conventional resist stripping process.

It is noted that although the drawings depict the formation of a single island structure 22, the present invention also contemplates the formation of a multitude of such island structures 22 on the surface of buried insulating layer 16. Each island 22 is generally small in size, having a lateral width of about 500 μm or less. More preferably, the island 22 has a lateral width from about 0.01 to about 100 μm. It should be noted that the width of the island 22 formed by the present invention must be sufficient to permit relaxation of the stress-providing film 20 by ensuring that the forces of relaxation in the island 22 outweigh the forces that oppose relaxation.

Next, a high temperature annealing process is performed which will allow strain transfer from the stress-providing layer 20 to the first semiconductor layer 18. The resultant structure formed after the high temperature annealing step has been performed is shown in FIG. 1C. In this drawing, reference numeral 24 is used to denote the strained first semiconductor layer. Note that some relaxation of the stress-providing layer 20 may occur during the high temperature annealing step of the present invention.

The heating step of the present invention is an annealing step that is performed at a temperature that causes the first semiconductor layer 18 to expand or contract laterally over the buried insulator layer 16. That is, the heating step of the present invention is performed to allow elastic relaxation of the strained-providing layer 20 by expansion of the underlying first semiconductor layer 18 on the buried insulating layer 16, which becomes viscous during this heating step.

The temperature of the heating step of the present invention is chosen to be above the reflow temperature of the buried insulating layer 16 at the first semiconductor/buried insulating layer interface. Specifically, the heating temperature employed in the present invention which achieves the above features is typically about 900° C. or greater, with a temperature from about 950° to about 1335° C. being more typical. Within the above temperature range, an equilibrium exists between the patterned stress-providing layer 20 and the first semiconductor layer 18 wherein the in-plane forces arising from the stress-providing layer 20 and the underlying first semiconductor layer 18 are allowed to cancel by expansion or contraction on the buried insulating layer 16. Moreover, the heating step of the present invention is performed within temperatures in which the amount of Ge diffusion is minimized in the case when the stress-providing layer 20 is a Ge-containing layer.

The heating step is typically carried out in an inert ambient such as He, Ar, N₂, Xe, Kr, Ne or a mixture thereof. The inert gas ambient may also be diluted with an oxygen-containing gas.

The heating step may be carried out for a variable period of time that typically ranges from about 1 sec to about 1800 minutes, with a time period from about 5 sec to about 600 minutes being more highly preferred. The heating step may be carried out at a single targeted temperature, or various ramp and soak cycles using various ramp rates and soak times can be employed.

After performing the heating step that causes strain transfer, the stress-providing layer 20 is then selectively removed so as to expose the now strained first semiconductor island layer 24. The stress-providing layer 20 is removed at this point of the present invention utilizing a number of etching techniques that are capable of selectively removing the stress-providing layer 20. For example, a timed etching process or a selective etching process can be used to remove the stress-providing layer 20 from the structure. The resultant structure formed after removal of the stress-providing layer 20 is shown in FIG. 1D.

After removing the stress-providing layer 20, an optional thermal treatment step may be performed to further improve the characteristics of the material. The thermal treatment may be a furnace step to anneal out residual damage caused by the optional implantations steps. Alternatively, a high temperature anneal in a H-containing ambient may be performed to remove excess boron from the strained first semiconductor layer 24.

In accordance with the present invention, the strained first semiconductor island layer 24 is located atop the insulating layer 16 and it has a thickness that is relatively thin (less than 500 Å). The strain may be compressive or tensile depending on the previous type of strain in the stress-providing layer 20. The strained first semiconductor island layer 24 has a defect density including misfits and TDs, of about 5×10⁶ defects/cm² or less. The stacking fault (SF) density of the strained first semiconductor island layer 24 is about 1000 defects/cm² or less.

The stacking fault density is measured using the etching technique described in U.S. Ser. No. 10/654,231, filed Sep. 3, 2003, the entire content of which is incorporated herein by reference.

The embodiment depicted in FIGS. 1A-1D describes the case wherein the strained first semiconductor island layers formed on the surface of the buried insulating layer each have the same type of strain (either positive or negative). In another embodiment of the present invention, as depicted in FIG. 2, a structure containing strained layers of different strain values (positive and/or negative) are formed atop the buried insulating layer. In particular, FIG. 2 shows a strained semiconductor structure that includes first strained semiconductor layer 24 of a first stain value on a surface of a buried insulating layer 16, and a second strained semiconductor layer 50 of a second strain value, that differs from the first, located atop the same buried insulating layer 16. The second strained semiconductor layer 50 is comprised of one of the semiconductor materials illustrated above for the first semiconductor layer 18.

In the embodiment shown in FIG. 2, two different stress-providing layers and lithography are used in forming the structure. Specifically, a first block mask (not shown) is formed over a predetermined portion of the semiconductor substrate 12 by lithography. With the first block mask in place, a first stress-providing layer 20 is formed atop the exposed portion of the first semiconductor layer 18. After forming the first stress-providing layer, the first block mask is removed and a second block mask is formed atop the portion of the layered structure including the first stress-providing layer 20. After second block mask formation which is performed via lithography, a second stress-providing layer that has a different stress value is formed atop the exposed portions of the first semiconductor layer 18 and the second block mask is removed. A conventional resist stripping process can be used in removing each of the block masks from the structure. The process flow is then the same as described above in FIGS. 1B-1D.

Alternatively, the structure shown in FIG. 2 can be formed by first performing the process steps depicted in FIGS. 1A-1D, then forming a block mask over the thus formed strained first semiconductor island layer 24. A semiconductor material including materials described above for the first semiconductor layer 18 can then be deposited atop exposed portions of the buried insulating layer 16. After deposition of the semiconductor material (which can be the same or different from layer 18), a second stress-providing layer having a different strain value than the first stress-providing layer is formed atop the semiconductor material and the processing steps described in FIGS. 1B-1D are then performed.

As an example, a 600 Å thick, 17 atomic percent SiGe layer was deposited on a 350 A thick SOI layer. Implantation of H was performed at 6.7 keV to a dose of 2.5×10¹⁶H/cm² placing the ion peak near the buried oxide/SOI layer. The SiGe/SOI layers were then patterned into roughly 10×10 μm islands and subjected to a 1100° C. rapid thermal anneal (few seconds). The SiGe was measured to be 40% relaxed thereby transferring 0.24% tensile strain into the underlying thin SOI layer. The extent of Ge diffusion into the SOI layer is below 15 Å for this thermal budget.

While the present invention has been particularly shown and described with respect to preferred embodiments thereof, it will be understood by those skilled in the art that the foregoing and other changes in forms and details may be made without departing from the spirit and scope of the present invention. It is therefore intended that the present invention not be limited to the exact forms and details described and illustrated, but fall within the scope of the appended claims.

*